statistiche per DU, BOYANG

Distribuzione geografica

Continente	#
EU - Europa	4797
NA - Nord America	3072
AS - Asia	485
SA - Sud America	22
AF - Africa	17
Continente sconosciuto - Info sul continente non disponibili	3
OC - Oceania	3
Totale	8399

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Nazione	#
US - Stati Uniti d'America	3058
IT - Italia	1145
GB - Regno Unito	1124
FR - Francia	1006
DE - Germania	914
CN - Cina	212
UA - Ucraina	192
RU - Federazione Russa	124
TR - Turchia	92
KR - Corea	82
NL - Olanda	78
JP - Giappone	60
SE - Svezia	39
FI - Finlandia	28
AT - Austria	23
ES - Italia	23
IR - Iran	18
IN - India	17
GR - Grecia	16
PL - Polonia	14
CA - Canada	13
BE - Belgio	10
RO - Romania	8
BR - Brasile	7
HR - Croazia	7
CL - Cile	6
EU - Europa	6
CH - Svizzera	5
TW - Taiwan	5
AR - Argentina	4
IL - Israele	4
RW - Ruanda	4
SG - Singapore	4
UY - Uruguay	4
ZA - Sudafrica	4
AU - Australia	3
DK - Danimarca	3
EE - Estonia	3
EG - Egitto	3
SN - Senegal	3
CI - Costa d'Avorio	2
CY - Cipro	2
CZ - Repubblica Ceca	2
HK - Hong Kong	2
HU - Ungheria	2
IE - Irlanda	2
NO - Norvegia	2
PK - Pakistan	2
PT - Portogallo	2
AL - Albania	1
AP - ???statistics.table.value.countryCode.AP???	1
BY - Bielorussia	1
BZ - Belize	1
CO - Colombia	1
ID - Indonesia	1
MY - Malesia	1
RS - Serbia	1
SD - Sudan	1
UZ - Uzbekistan	1
Totale	8399

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Città	#
Ashburn	1080
Southend	1043
Turin	296
Seattle	292
Fairfield	283
Torino	283
Woodbridge	192
San Ramon	135
Houston	132
Cambridge	113
Ann Arbor	110
Wilmington	106
Jacksonville	85
Izmir	74
Boardman	52
San Donato Milanese	52
Beijing	44
Saint Petersburg	40
Dearborn	37
Mountain View	37
Penza	36
Rotterdam	35
Milan	32
Buffalo	30
Zaporozhye	28
Guangzhou	27
San Francisco	27
Helsinki	25
Shanghai	25
Vienna	23
Redwood City	22
Valfenera	22
Hangzhou	19
Malatya	18
Monopoli	18
Zhengzhou	16
Cottbus	15
Shenzhen	15
Frankfurt	14
Lecce	14
Paris	14
Baltimore	13
Fremont	12
Kraków	12
Provo	12
San Antonio	12
Seoul	12
Rome	11
Changsha	10
Herkenbosch	10
Madrid	10
Montirone	10
Vólos	10
Amsterdam	8
Chicago	8
Nürnberg	8
Pennsylvania Furnace	8
Austin	7
Nieuw-vennep	7
Almese	6
Anzio	6
Cupertino	6
Dallas	6
Kunming	6
Lansing	6
Melun	6
Rivoli	6
Tehran	6
Cumiana	5
Fujian	5
Manchester	5
Moscow	5
Nanjing	5
Osaka	5
Phoenix	5
Putian	5
Toronto	5
Aosta	4
Boves	4
Catania	4
Chengdu	4
Durham	4
Fontenay-aux-roses	4
Fukuoka	4
Iasi	4
Imola	4
Ivrea	4
Las Vegas	4
San Mauro Torinese	4
Settimo Torinese	4
Zagreb	4
Biella	3
Bilbao	3
Brussels	3
Buenos Aires	3
Cameri	3
Chiusi	3
Columbus	3
Cortazzone	3
Cuneo	3
Totale	5323

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Nome	#
Fault Tolerant Electronic System Design	484
A New Solution to On-Line Detection of Control Flow Errors	402
A New Simulation-Based Fault Injection Approach for the Evaluation of Transient Errors in GPGPUs	379
On the Functional Test of the Register Forwarding and Pipeline Interlocking Unit in Pipelined Processors	350
Analysis and mitigation of single event effects on flash-based FPGAS	343
Accurate Analysis of SET effects on Flash-based FPGA System-on-a-Chip for Satellite Applications	340
Accurate Mitigation of Single Event Effects on Flash-based FPGAs: A new Design Flow	337
Radiation-induced single event transients modeling and testing on nanometric flash-based technologies	286
SET-PAR: Place and Route Tools for the Mitigation of Single Event Transients on Flash-Based FPGAs	277
A Selective Mapper for the Mitigation of SETs on Rad-Hard RTG4 Flash-based FPGAs	276
EXPLOITING THE DEBUG INTERFACE TO SUPPORT ON LINE TEST OF CONTROL FLOW ERRORS	266
Analysis and mitigation of SEUs in ARM-based SoC on Xilinx Virtex-V SRAM-based FPGAS	257
Scalable FPGA Graph model to detect routing faults	250
A new EDA flow for the Mitigation of SEUs in Dynamic Reconfigurable FPGAs	248
A New Hybrid Nonintrusive Error-Detection Technique Using Dual Control-Flow Monitoring	247
On the Design of Highly Reliable System-on-Chip using Dynamically Reconfigurable FPGAs	243
Online Test of Control Flow Errors: A New Debug Interface-Based Approach	242
A Functional Test Algorithm for the Register Forwarding and Pipeline Interlocking unit in Pipelined Microprocessors	235
Accurate Analysis of SET effects on Flash-based FPGA System-on-a-Chip for Satellite Applications	231
FPGA-controlled PCBA power-on self-test using processor's debug features	229
Hybrid soft error mitigation techniques for COTS processor-based systems	222
On the prediction of Radiation-induced SETs in Flash-based FPGAs	220
A new approach for Total Ionizing Dose effect analysis on Flash-based FPGA	216
Evaluation of transient errors in GPGPUs for safety critical applications: An effective simulation-based fault injection environment	203
Effective Mitigation of Radiation-induced Single Event Transient on Flash-based FPGAs	170
Accurate Analysis of SET effects on Flash-based FPGA System-on-a-Chip for Satellite Application	159
An FPGA-based testing platform for the validation of automotive powertrain ECU	148
Online monitoring soft errors in reconfigurable FPGA during radiation test	126
Fault-tolerance techniques for soft-core processors using the trace interface	126
A Novel Error Rate Estimation Approach for UltraScale+ SRAM-based FPGAs	71
An extended model to support detailed GPGPU reliability analysis	71
A Zero-Timing Overhead SET Mitigation Approach for Flash-based FPGAs	67
On the evaluation of SEU effects in GPGPUs	63
About the functional test of the GPGPU scheduler	59
A new Method for the Analysis of Radiation-induced Effects in 3D VLSI Face-to-Back LUTs	54
A new CAD tool for Single Event Transient Analysis and Mitigation on Flash-based FPGAs	52
Ultra High Energy Heavy Ion Test Beam on Xilinx Kintex-7 SRAM-based FPGA	50
Analysis of Radiation-induced SETs in 3D VLSI Face-to-Back LUTs	50
SETA: A CAD tool for Single Event Transient Analysis and Mitigation on Flash-based FPGAs	47
On the Mitigation of Single Event Transients on Flash-based FPGAs	47
Radiation-induced Single Event Transient effects during the reconfiguration process of SRAM-based FPGAs	44
SETA-RAY: A New IDE tool for Predicting, Analyzing and Mitigating Radiation-induced Soft Errors on FPGAs	43
On the analysis of radiation-induced Single Event Transients on SRAM-based FPGAs	40
Analyzing Radiation-induced Transient Errors on SRAM-based FPGAs by Propagation of Broadening Effect	40
Fault tolerant electronic system design	36
FlexGripPlus: An improved GPGPU model to support reliability analysis	33
Rad-Ray: A new Simulation Tool for the Analysis of Heavy Ions-induced SETs on ICs	31
On the Reliability of Convolutional Neural Network Implementation on SRAM-based FPGA	31
A 3D Simulation-based Approach to Analyze Heavy Ions-induced SET on Digital Circuits	19
Electron inducing soft errors in 28 nm system-on-Chip	16
On the Mitigation of Single Event Transient in 3D LUT by In-Cell Layout Resizing	13
Totale	8489

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Categoria	#
all - tutte	11592
article - articoli	2278
book - libri	0
conference - conferenze	8594
curatela - curatele	0
other - altro	0
patent - brevetti	0
selected - selezionate	0
volume - volumi	141
Totale	22605

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	Totale	Lug	Ago	Sett	Ott	Nov	Dic	Gen	Feb	Mar	Apr	Mag	Giu
2015/2016	558	0	0	0	0	0	0	37	53	46	144	97	181
2016/2017	1444	72	105	80	87	153	58	99	91	96	179	221	203
2017/2018	2341	141	327	200	190	318	228	228	286	197	72	62	92
2018/2019	1361	56	47	116	123	39	71	71	48	83	182	276	249
2019/2020	1522	140	120	82	207	234	147	119	159	150	75	51	38
2020/2021	642	112	157	69	92	47	108	57	0	0	0	0	0
Totale													8489

PORTO @ Archivio Istituzionale della Ricerca

statistiche per DU, BOYANG

Distribuzione geografica