Archivio Istituzionale della RicercaSTERPONE, LUCA
STERPONE, LUCA
Dipartimento di Automatica e Informatica
013725
CNN-Oriented Placement Algorithm for High-Performance Accelerators on Rad-Hard FPGAs
2023 Sterpone, L.; Azimi, S.; De Sio, C
Evaluating Reliability against SEE of Embedded Systems: A Comparison of RTOS and Bare-metal Approaches
2023 DE SIO, Corrado; Azimi, Sarah; Sterpone, Luca
Exploring the Impact of Soft Errors on the Reliability of Real-Time Embedded Operating Systems
2023 Azimi, Sarah; DE SIO, Corrado; Portaluri, Andrea; Rizzieri, Daniele; Vacca, Eleonora; Sterpone, Luca; Merodio Codinachs, David
Fighting for a Future Free from Violence: A Framework for Real-time Detection of “Signal for Help”
2023 Azimi, Sarah; De Sio, Corrado; Carlucci, Francesco; Sterpone, Luca
A Comparative Radiation Analysis of Reconfigurable Memory Technologies: FinFET versus Bulk CMOS
2022 Azimi, S.; De Sio, C.; Portaluri, A.; Rizzieri, D.; Sterpone, L.
An Automated Continuous Integration Multitest Platform for Automotive Systems
2022 Du, Boyang; Azimi, Sarah; Moramarco, Annarita; Sabena, Davide; Parisi, Filippo; Sterpone, Luca
Evaluating low-level software-based hardening techniques for configurable GPU architectures
2022 Goncalves, Marcio M.; Rodriguez Condia, Josie Esteban; Sonza Reorda, Matteo; Sterpone, Luca; Azambuja, Jose Rodrigo
Failure rate analysis of radiation tolerant design techniques on SRAM-based FPGAs
2022 Vacca, Eleonora; Azimi, Sarah; Sterpone, Luca
FireNN: Neural Networks Reliability Evaluation on Hybrid Platforms
2022 De Sio, C.; Azimi, S.; Sterpone, L.
FPGA Qualification and Failure Rate Estimation Methodology for LHC Environments Using Benchmarks Test Circuits
2022 Scialdone, A.; Ferraro, R.; Alía, R. G.; Sterpone, L.; Masi, S. Danzeca and A.
A Radiation-Hardened CMOS Full-Adder Based on Layout Selective Transistor Duplication
2021 Azimi, Sarah; De Sio, Corrado; Sterpone, Luca
Analysis of Radiation-induced Transient Errors on 7nm FinFET Technology
2021 Azimi, Sarah; De Sio, Corrado; Sterpone, Luca
Analysis of Single Event Effects on Embedded Processor
2021 Azimi, Sarah; De Sio, Corrado; Rizzieri, Daniele; Sterpone, Luca
DYRE: a DYnamic REconfigurable solution to increase GPGPU's reliability
2021 Rodriguez Condia, Josie E.; Narducci, Pierpaolo; Sonza Reorda, Matteo; Sterpone, Luca
Reliability assessment on 16 nm ultrascale+ MPSoC using fault injection and fault tree analysis
2021 Yang, Weitao; Du, Boyang; He, Chaohui; Sterpone, Luca
Single-event-effect propagation investigation on nanoscale system on chip by applying heavy-ion microbeam and event tree analysis
2021 Yang, Wei-Tao; Du, Xue-Cheng; Li, Yong-Hong; He, Chao-Hui; Guo, Gang; Shi, Shu-Ting; Cai, Li; Azimi, Sarah; De Sio, Corrado; Sterpone, Luca
A 3D Simulation-based Approach to Analyze Heavy Ions-induced SET on Digital Circuits
2020 Sterpone, L.; Luoni, F.; Azimi, S.; Du, B.
An Optimized Frame-Driven Routing Algorithm for Reconfigurable SRAM-based FPGAs
2020 Bozzoli, Ludovica; Sterpone, Luca
Electron inducing soft errors in 28 nm system-on-Chip
2020 Yang, W.; Li, Y.; Zhang, W.; Guo, Y.; Zhao, H.; Wei, J.; Li, Y.; He, C.; Chen, K.; Guo, G.; Du, B.; Sterpone, L.
FlexGripPlus: An improved GPGPU model to support reliability analysis
2020 Rodriguez Condia, Josie E.; Du, Boyang; Sonza Reorda, Matteo; Sterpone, Luca
| Citazione | Data di pubblicazione | Autori | File |
|---|---|---|---|
| CNN-Oriented Placement Algorithm for High-Performance Accelerators on Rad-Hard FPGAs / Sterpone, L.; Azimi, S.; De Sio, C. - In: IEEE TRANSACTIONS ON COMPUTER-AIDED DESIGN OF INTEGRATED CIRCUITS AND SYSTEMS. - ISSN 0278-0070. - (2023), pp. 1-13. [10.1109/TCAD.2023.3331976] | 1-gen-2023 | Sterpone, L.Azimi, S.De Sio, C | TCAD_2023.pdf |
| Evaluating Reliability against SEE of Embedded Systems: A Comparison of RTOS and Bare-metal Approaches / DE SIO, Corrado; Azimi, Sarah; Sterpone, Luca. - In: MICROELECTRONICS RELIABILITY. - ISSN 0026-2714. - 150:(2023). [10.1016/j.microrel.2023.115124] | 1-gen-2023 | Corrado De SioSarah AzimiLuca Sterpone | MicRel_V2.2_CD.pdf; 1-s2.0-S002627142300224X-main.pdf |
| Exploring the Impact of Soft Errors on the Reliability of Real-Time Embedded Operating Systems / Azimi, Sarah; DE SIO, Corrado; Portaluri, Andrea; Rizzieri, Daniele; Vacca, Eleonora; Sterpone, Luca; Merodio Codinachs, David. - In: ELECTRONICS. - ISSN 2079-9292. - 12:1(2023), p. 169. [10.3390/electronics12010169] | 1-gen-2023 | Sarah AzimiCorrado De SioAndrea PortaluriDaniele RizzieriEleonora VaccaLuca Sterpone + | electronics-12-00169.pdf |
| Fighting for a Future Free from Violence: A Framework for Real-time Detection of “Signal for Help” / Azimi, Sarah; De Sio, Corrado; Carlucci, Francesco; Sterpone, Luca. - In: INTELLIGENT SYSTEMS WITH APPLICATIONS. - ISSN 2667-3053. - 17:(2023), pp. 1-24. [10.1016/j.iswa.2022.200174] | 1-gen-2023 | Azimi, SarahDe Sio, CorradoCarlucci, FrancescoSterpone, Luca | ISwA_2023.pdf |
| A Comparative Radiation Analysis of Reconfigurable Memory Technologies: FinFET versus Bulk CMOS / Azimi, S.; De Sio, C.; Portaluri, A.; Rizzieri, D.; Sterpone, L.. - In: MICROELECTRONICS RELIABILITY. - ISSN 0026-2714. - 138:(2022), pp. 1-5. [10.1016/j.microrel.2022.114733] | 1-gen-2022 | S. AzimiC. De SioA. PortaluriD. RizzieriL. Sterpone | MicRel_CMOSvsFinFET_V3_fin.pdf; 1-s2.0-S0026271422002578-main.pdf |
| An Automated Continuous Integration Multitest Platform for Automotive Systems / Du, Boyang; Azimi, Sarah; Moramarco, Annarita; Sabena, Davide; Parisi, Filippo; Sterpone, Luca. - In: IEEE SYSTEMS JOURNAL. - ISSN 1932-8184. - ELETTRONICO. - 16:2(2022), pp. 2495-2506. [10.1109/JSYST.2021.3069548] | 1-gen-2022 | Du, BoyangAzimi, SarahMoramarco, AnnaritaSabena, DavideSterpone, Luca + | IEEESystem_2021.pdf; An_Automated_Continuous_Integration_Multitest_Platform_for_Automotive_Systems.pdf |
| Evaluating low-level software-based hardening techniques for configurable GPU architectures / Goncalves, Marcio M.; Rodriguez Condia, Josie Esteban; Sonza Reorda, Matteo; Sterpone, Luca; Azambuja, Jose Rodrigo. - In: THE JOURNAL OF SUPERCOMPUTING. - ISSN 0920-8542. - ELETTRONICO. - 78:6(2022), pp. 8081-8105. [10.1007/s11227-021-04154-z] | 1-gen-2022 | Rodriguez Condia, Josie EstebanSonza Reorda, MatteoSterpone, Luca + | Goncalves2022_Article_EvaluatingLow-levelSoftware-ba.pdf; JSupercomp___Software_based_for_FlexGrip.pdf |
| Failure rate analysis of radiation tolerant design techniques on SRAM-based FPGAs / Vacca, Eleonora; Azimi, Sarah; Sterpone, Luca. - In: MICROELECTRONICS RELIABILITY. - ISSN 0026-2714. - ELETTRONICO. - 138:(2022). [10.1016/j.microrel.2022.114778] | 1-gen-2022 | Vacca, EleonoraAzimi, SarahSterpone, Luca | microelectronics_reliability_camera_ready.pdf; 3220228.3220229.pdf |
| FireNN: Neural Networks Reliability Evaluation on Hybrid Platforms / De Sio, C.; Azimi, S.; Sterpone, L.. - In: IEEE TRANSACTIONS ON EMERGING TOPICS IN COMPUTING. - ISSN 2168-6750. - ELETTRONICO. - 10:2(2022), pp. 549-563. [10.1109/TETC.2022.3152668] | 1-gen-2022 | De Sio C.Azimi S.Sterpone L. | FireNN_cd_2.2.pdf; FireNN_Neural_Networks_Reliability_Evaluation_on_Hybrid_Platforms.pdf |
| FPGA Qualification and Failure Rate Estimation Methodology for LHC Environments Using Benchmarks Test Circuits / Scialdone, A.; Ferraro, R.; Alía, R. G.; Sterpone, L.; Masi, S. Danzeca and A.. - In: IEEE TRANSACTIONS ON NUCLEAR SCIENCE. - ISSN 0018-9499. - ELETTRONICO. - 69:7(2022), pp. 1633-1641. [10.1109/TNS.2022.3162037] | 1-gen-2022 | L. Sterpone + | FPGA_Qualification_and_Failure_Rate_Estimation_Methodology_for_LHC_Environments_Using_Benchmarks_Test_Circuits (1).pdf; FPGA_Qualification_and_Failure_Rate_Estimation_Methodology_for_LHC_Environments_Using_Benchmarks_Test_Circuits.pdf |
| A Radiation-Hardened CMOS Full-Adder Based on Layout Selective Transistor Duplication / Azimi, Sarah; De Sio, Corrado; Sterpone, Luca. - In: IEEE TRANSACTIONS ON VERY LARGE SCALE INTEGRATION (VLSI) SYSTEMS. - ISSN 1063-8210. - ELETTRONICO. - 29:8(2021), pp. 1596-1600. [10.1109/TVLSI.2021.3086897] | 1-gen-2021 | Azimi, SarahDe Sio, CorradoSterpone, Luca | ToVLSI-Final Version.pdf; A_Radiation-Hardened_CMOS_Full-Adder_Based_on_Layout_Selective_Transistor_Duplication.pdf |
| Analysis of Radiation-induced Transient Errors on 7nm FinFET Technology / Azimi, Sarah; De Sio, Corrado; Sterpone, Luca. - In: MICROELECTRONICS RELIABILITY. - ISSN 0026-2714. - ELETTRONICO. - 126:(2021). [10.1016/j.microrel.2021.114319] | 1-gen-2021 | Azimi, SarahDe Sio, CorradoSterpone, Luca | MicRel 2021.pdf; 1-s2.0-S0026271421002857-main.pdf |
| Analysis of Single Event Effects on Embedded Processor / Azimi, Sarah; De Sio, Corrado; Rizzieri, Daniele; Sterpone, Luca. - In: ELECTRONICS. - ISSN 2079-9292. - ELETTRONICO. - 10:24(2021), p. 3160. [10.3390/electronics10243160] | 1-gen-2021 | Azimi, SarahDe Sio, CorradoRizzieri, DanieleSterpone, Luca | electronics-10-03160 (1).pdf |
| DYRE: a DYnamic REconfigurable solution to increase GPGPU's reliability / Rodriguez Condia, Josie E.; Narducci, Pierpaolo; Sonza Reorda, Matteo; Sterpone, Luca. - In: THE JOURNAL OF SUPERCOMPUTING. - ISSN 0920-8542. - ELETTRONICO. - (2021). [10.1007/s11227-021-03751-2] | 1-gen-2021 | Rodriguez Condia, Josie E.Sonza Reorda, MatteoSterpone, Luca + | Condia2021_Article_DYREADYnamicREconfigurableSolu.pdf |
| Reliability assessment on 16 nm ultrascale+ MPSoC using fault injection and fault tree analysis / Yang, Weitao; Du, Boyang; He, Chaohui; Sterpone, Luca. - In: MICROELECTRONICS RELIABILITY. - ISSN 0026-2714. - 120:(2021), p. 114122. [10.1016/j.microrel.2021.114122] | 1-gen-2021 | Yang, WeitaoDu, BoyangSterpone, Luca + | 1-s2.0-S0026271421000883-main.pdf |
| Single-event-effect propagation investigation on nanoscale system on chip by applying heavy-ion microbeam and event tree analysis / Yang, Wei-Tao; Du, Xue-Cheng; Li, Yong-Hong; He, Chao-Hui; Guo, Gang; Shi, Shu-Ting; Cai, Li; Azimi, Sarah; De Sio, Corrado; Sterpone, Luca. - In: NUCLEAR SCIENCE AND TECHNIQUES. - ISSN 1001-8042. - 32:10(2021). [10.1007/s41365-021-00943-6] | 1-gen-2021 | Azimi, SarahDe Sio, CorradoSterpone, Luca + | Yang2021_Article_Single-event-effectPropagation (1).pdf |
| A 3D Simulation-based Approach to Analyze Heavy Ions-induced SET on Digital Circuits / Sterpone, L.; Luoni, F.; Azimi, S.; Du, B.. - In: IEEE TRANSACTIONS ON NUCLEAR SCIENCE. - ISSN 0018-9499. - (2020). [10.1109/TNS.2020.3006997] | 1-gen-2020 | L. SterponeS. AzimiB. Du + | FINAL_VERSION.pdf; 09133159.pdf |
| An Optimized Frame-Driven Routing Algorithm for Reconfigurable SRAM-based FPGAs / Bozzoli, Ludovica; Sterpone, Luca. - In: IEEE ACCESS. - ISSN 2169-3536. - (2020), pp. 1-13. [10.1109/ACCESS.2020.2978632] | 1-gen-2020 | Bozzoli, LudovicaSterpone, Luca | 09025243.pdf |
| Electron inducing soft errors in 28 nm system-on-Chip / Yang, W.; Li, Y.; Zhang, W.; Guo, Y.; Zhao, H.; Wei, J.; Li, Y.; He, C.; Chen, K.; Guo, G.; Du, B.; Sterpone, L.. - In: RADIATION EFFECTS AND DEFECTS IN SOLIDS. - ISSN 1042-0150. - 175:7-8(2020), pp. 745-754. [10.1080/10420150.2020.1759067] | 1-gen-2020 | Yang W.Du B.Sterpone L. + | Electron inducing soft errors in 28 nm system on Chip.pdf |
| FlexGripPlus: An improved GPGPU model to support reliability analysis / Rodriguez Condia, Josie E.; Du, Boyang; Sonza Reorda, Matteo; Sterpone, Luca. - In: MICROELECTRONICS RELIABILITY. - ISSN 0026-2714. - 109:(2020), pp. 1-14. [10.1016/j.microrel.2020.113660] | 1-gen-2020 | Rodriguez Condia, Josie E.Du, BoyangSonza Reorda, MatteoSterpone, Luca | journal-version-V20.pdf; 1-s2.0-S0026271419307978-main.pdf |