SONZA REORDA, MATTEO

SONZA REORDA, MATTEO  

Dipartimento di Automatica e Informatica  

REORDA M. S; Reorda, Matteo Sonza; Reorda M. Sonza; M. Sonza Reorda; Reorda, M. S.; M.S. Reorda; Matteo Sonza Reorda  

001894  

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Citazione Data di pubblicazione Autori File
Assessing the Effectiveness of the Test of Power Devices at the Board Level / Piumatti, Davide; Borlo, Stefano; Mandrile, Fabio; SONZA REORDA, Matteo; Bojoi, IUSTIN RADU. - IEEE DCIS19:(In corso di stampa), pp. 1-6. ((Intervento presentato al convegno 34th IEEE Conference on Design of Circuits and Integrated Systems (DCIS 19) tenutosi a Bilbao, Spain nel November 20 – 22, 2019 [10.1109/DCIS201949030.2019.8959845]. In corso di stampa Davide PiumattiBORLO, STEFANOFabio MandrileMatteo Sonza ReordaRadu Bojoi Assessing the Effectiveness of the Test of Power Devices at the Board Level (5C7B5).pdf08959845.pdf
Recent Trends and Perspectives on Defect-Oriented Testing / Bernardi, P.; Cantoro, R.; Coyette, A.; Dobbeleare, W.; Fieback, M.; Floridia, A.; Gielen, G.; Gomez, J.; Grosso, M.; Guerriero, A. M.; Guglielminetti, I.; Hamdioui, S.; Insinga, G.; Mautone, N.; Mirabella, N.; Sartoni, S.; Sonza Reorda, M.; Ullmann, R.; Vanhooren, R.; Xama, N.; Wu, L.. - (In corso di stampa). ((Intervento presentato al convegno The 28th IEEE International Symposium on On-Line Testing and Robust System Design (IOLTS). In corso di stampa P. BernardiR. CantoroA. FloridiaM. GrossoS. HamdiouiG. InsingaN. MirabellaS. SartoniM. Sonza ReordaL. Wu + _IOLTS2022__Special_Session__Recent_Trends_and_Perspectives_on_Defect_Oriented_Testing.pdf
A comparative overview of ATPG flows targeting traditional and cell-aware fault models / Mirabella, Nunzio; Floridia, Andrea; Cantoro, Riccardo; Grosso, Michelangelo; Sonza Reorda, Matteo. - ELETTRONICO. - (In corso di stampa), pp. 1-4. ((Intervento presentato al convegno 29th IEEE International Conference on Electronics Circuits and Systems (ICECS) tenutosi a Glasgow nel 24th - 26th October 2022. In corso di stampa Mirabella, NunzioFloridia, AndreaCantoro, RiccardoGrosso, MichelangeloSonza Reorda, Matteo ICECS_2022_1.2.pdfConference_paper_1.2_submitted.docx
A New Technique to Check the Correct Mounting of the Power Module Heatsinks / Quitadamo, Matteo Vincenzo; Piumatti, Davide; Raviola, Erica; Fiori, Franco; Sonza Reorda, Matteo. - In: MICROELECTRONICS RELIABILITY. - ISSN 0026-2714. - ELETTRONICO. - 128:(2022). [10.1016/j.microrel.2021.114416] 1-gen-2022 Quitadamo, Matteo VincenzoPiumatti, DavideRaviola, EricaFiori, FrancoSonza Reorda, Matteo Termico_FINALpoof.pdf1-s2.0-S0026271421003826-main.pdf
Using STLs for Effective In-field Test of GPUs / Rodriguez Condia, Josie E.; Augusto Da Silva, Felipe; Cagri Bagbaba, Ahmet; Juan-David, Guerrero-Balaguera; Hamdioui, Said; Sauer, Christian; SONZA REORDA, Matteo. - In: IEEE DESIGN & TEST. - ISSN 2168-2356. - ELETTRONICO. - (2022), pp. 1-1. [10.1109/MDAT.2022.3188573] 1-gen-2022 Josie E. Rodriguez CondiaJuan-David Guerrero-BalagueraSaid HamdiouiMatteo Sonza Reorda + DT_DT-2021-10-0106.R2_RODRIGUEZ CONDIA.pdf
Reliability Assessment of Neural Networks in GPUs: A Framework For Permanent Faults Injections / Guerrero-Balaguera, Juan-David; Galasso, Luigi; Sierra, Robert Limas; Reorda, Matteo Sonza. - ELETTRONICO. - (2022), pp. 959-962. ((Intervento presentato al convegno 2022 IEEE 31st International Symposium on Industrial Electronics (ISIE) [10.1109/ISIE51582.2022.9831549]. 1-gen-2022 Guerrero-Balaguera, Juan-DavidReorda, Matteo Sonza + Reliability_Assessment_of_Neural_Networks_in_GPUs_A_Framework_For_Permanent_Faults_Injections.pdf
Test, Reliability and Functional Safety Trends for Automotive System-on-Chip / Angione, F.; Appello, D.; Aribido, J.; Athavale, J.; Bellarmino, N.; Bernardi, P.; Cantoro, R.; De Sio, C.; Foscale, T.; Gavarini, G.; Guerrero, J.; Huch, M.; Iaria, G.; Kilian, T.; Mariani, R.; Martone, R.; Ruospo, A.; Sanchez, E.; Schlichtmann, U.; Squillero, G.; Sonza Reorda, M.; Sterpone, L.; Tancorre, V.; Ugioli, R.. - (2022), pp. 1-10. ((Intervento presentato al convegno 2022 IEEE European Test Symposium (ETS) tenutosi a Barcelona (Spain) nel 01 July 2022 [10.1109/ETS54262.2022.9810388]. 1-gen-2022 F. AngioneN. BellarminoP. BernardiR. CantoroC. De SioT. FoscaleG. GavariniJ. GuerreroG. IariaR. MarianiA. RuospoG. SquilleroM. Sonza ReordaL. Sterpone + 2022_ETS_SpecialSession.pdfTest_Reliability_and_Functional_Safety_Trends_for_Automotive_System-on-Chip.pdf
A novel SEU injection setup for Automotive SoC / Iaria, G.; Foscale, T.; Bernardi, P.; Presicce, L.; Sonza Reorda, M.; Appello, D.; Tancorre, V.; Ugioli, R.. - (2022), pp. 623-626. ((Intervento presentato al convegno 2022 IEEE International Symposium on Industrial Electronics tenutosi a Anchorage, AK (USA) nel 01-03 June 2022 [10.1109/ISIE51582.2022.9831533]. 1-gen-2022 G. IariaT. FoscaleP. BernardiL. PresicceM. Sonza Reorda + A_novel_SEU_injection_setup_for_Automotive_SoC.pdf
Evaluating low-level software-based hardening techniques for configurable GPU architectures / Goncalves, Marcio M.; Rodriguez Condia, Josie Esteban; Sonza Reorda, Matteo; Sterpone, Luca; Azambuja, Jose Rodrigo. - In: THE JOURNAL OF SUPERCOMPUTING. - ISSN 0920-8542. - ELETTRONICO. - 78:6(2022), pp. 8081-8105. [10.1007/s11227-021-04154-z] 1-gen-2022 Rodriguez Condia, Josie EstebanSonza Reorda, MatteoSterpone, Luca + Goncalves2022_Article_EvaluatingLow-levelSoftware-ba.pdfJSupercomp___Software_based_for_FlexGrip.pdf
Test, Reliability and Functional Safety trends for Automotive System-on-Chip / Angione, F.; Appello, D.; Aribido, J.; Bellarmino, N.; Bernardi, P.; Cantoro, R.; de Sio, C.; Foscale, T.; Gavarini, G.; Huch, M.; Kilian, T; Mariani, R.; Martone, R.; Ruospo, A.; Sanchez, E.; Schlichtmann, U.; Squillero, G.; Sonza Reorda, M.; Sterpone, L.; Tancorre, V.; Ugioli, R.. - (2022). ((Intervento presentato al convegno IEEE European Test Symposium. 1-gen-2022 F. AngioneN. BellarminoP. BernardiR. CantoroC. de SioT. FoscaleG. GavariniA. RuospoE. SanchezG. SquilleroM. Sonza ReordaL. Sterpone + 01_ETS_special_session_ABSTRACT.pdf
Automated Identification of Application-Dependent Safe Faults in Automotive Systems-on-a-Chips / Bagbaba, A. C.; da Silva, F. A.; Reorda, M. S.; Hamdioui, S.; Jenihhin, M.; Sauer, C.. - In: ELECTRONICS. - ISSN 2079-9292. - 11:3(2022), p. 319. [10.3390/electronics11030319] 1-gen-2022 Reorda M. S.Hamdioui S. + electronics-11-00319-v2.pdf
Exploiting post-silicon debug hardware to improve the fault coverage of Software Test Libraries / Cantoro, Riccardo; Garau, Francesco; Masante, Riccardo; Sartoni, Sandro; Singh, Virendra; Reorda, Matteo Sonza. - (2022), pp. 1-7. ((Intervento presentato al convegno 2022 IEEE 40th VLSI Test Symposium (VTS) tenutosi a San Diego (USA) nel 25-27 Aprile 2022 [10.1109/VTS52500.2021.9794219]. 1-gen-2022 Cantoro, RiccardoGarau, FrancescoMasante, RiccardoSartoni, SandroReorda, Matteo Sonza + VTS22___Exploiting_post_silicon_debug_hardware_to_improve_the_fault_coverage_of_Software_Test_Libraries__CAMERA_READY_.pdfExploiting_post-silicon_debug_hardware_to_improve_the_fault_coverage_of_Software_Test_Libraries.pdf
A New Method to Generate Software Test Libraries for In-Field GPU Testing Resorting to High-Level Languages / Guerrero-Balaguera, Juan-David; Rodriguez Condia, Josie Esteban; Sonza Reorda, Matteo. - ELETTRONICO. - (2022), pp. 1-7. ((Intervento presentato al convegno 40th IEEE VLSI Test Symposium, VTS 2022 tenutosi a San Diego (USA) nel 25-27 April 2022 [10.1109/VTS52500.2021.9794225]. 1-gen-2022 Guerrero-Balaguera, Juan-DavidRodriguez Condia, Josie EstebanSonza Reorda, Matteo A_New_Method_to_Generate_Software_Test_Libraries_for_In-Field_GPU_Testing_Resorting_to_High-Level_Languages.pdf
A Systematic Method to Generate Effective STLs for the In-Field Test of CAN Bus Controllers / da Silva, Felipe Augusto; Cantoro, Riccardo; Hamdioui, Said; Sartoni, Sandro; Sauer, Christian; Sonza Reorda, Matteo. - In: ELECTRONICS. - ISSN 2079-9292. - 11:16(2022), p. 2481. [10.3390/electronics11162481] 1-gen-2022 Cantoro, RiccardoHamdioui, SaidSartoni, SandroSonza Reorda, Matteo + electronics-11-02481-v2.pdf
Effective fault simulation of GPU’s permanent faults for reliability estimation of CNNs / Guerrero-Balaguera, Juan-David; Sierra, Robert Limas; Reorda, Matteo Sonza. - (2022), pp. 1-6. ((Intervento presentato al convegno 2022 IEEE 28th International Symposium on On-Line Testing and Robust System Design (IOLTS) tenutosi a Torino [10.1109/IOLTS56730.2022.9897823]. 1-gen-2022 Guerrero-Balaguera, Juan-DavidReorda, Matteo Sonza + Effective_fault_simulation_of_GPUs_permanent_faults_for_reliability_estimation_of_CNNs.pdf
Effective techniques for automatically improving the transition delay fault coverage of Self-Test Libraries / Cantoro, Riccardo; Garau, Francesco; Girard, Patrick; Kolahimahmoudi, Nima; Sartoni, Sandro; Reorda, Matteo Sonza; Virazel, Arnaud. - (2022), pp. 1-2. ((Intervento presentato al convegno 2022 IEEE European Test Symposium tenutosi a Barcelona (SP) nel 23-27 Maggio 2022 [10.1109/ETS54262.2022.9810392]. 1-gen-2022 Cantoro, RiccardoGarau, FrancescoSartoni, SandroReorda, Matteo Sonza + ETS22___Effective_techniques_for_automatically_improving_the_transition_delay_fault_coverage_of_Self_Test_Libraries.pdfEffective_techniques_for_automatically_improving_the_transition_delay_fault_coverage_of_Self-Test_Libraries.pdf
Using Formal Methods to Support the Development of STLs for GPUs / Deligiannis, Nikolaos; Faller, Tobias; RODRIGUEZ CONDIA, JOSIE ESTEBAN; Cantoro, Riccardo; Becker, Bernd; SONZA REORDA, Matteo. - (2022). ((Intervento presentato al convegno Asian Test Symposium (ATS) tenutosi a Taiwan. 1-gen-2022 Nikolaos DeligiannisJosie Esteban RodriguezRiccardo CantoroMatteo Sonza Reorda + _ATS2022__Using_Formal_Methods_to_Support_the_Development_of_STLs_for_GPUs.pdf
An Experimental Evaluation of Resistive Defects and Different Testing Solutions in Low-Power Back-Biased SRAM Cells / Mirabella, N.; Grosso, M.; Franchino, G.; Rinaudo, S.; Deretzis, I.; La Magna, A.; Reorda, M. S.. - In: ELECTRONICS. - ISSN 2079-9292. - ELETTRONICO. - 11:2(2022), p. 203. [10.3390/electronics11020203] 1-gen-2022 Mirabella N.Grosso M.Reorda M. S. + electronics-11-00203.pdfMDPI_Paper.pdf
Evaluating the impact of Permanent Faults in a {GPU} running a Deep Neural Network / Juan-David, Guerrero-Balaguera; Galasso, Luigi; LIMAS SIERRA, ROBERT ALEXANDER; Ernesto, Sanchez; SONZA REORDA, Matteo. - (2022), pp. 96-101. ((Intervento presentato al convegno 2022 {IEEE} International Test Conference in Asia ({ITC}-Asia) tenutosi a Taipei (Taiwan) nel 24-26 August 2022 [10.1109/itcasia55616.2022.00027]. 1-gen-2022 Juan-David Guerrero-BalagueraRobert Limas SierraErnesto SanchezMatteo Sonza Reorda + 2022_ITC_ASIA_CNNs_Reliability_Registers_cameraready.pdfEvaluating_the_impact_of_Permanent_Faults_in_a_GPU_running_a_Deep_Neural_Network.pdf
Improving the Fault Resilience of Neural Network Applications Through Security Mechanisms / Deligiannis, Nikolaos; Cantoro, Riccardo; SONZA REORDA, Matteo; Traiola, Marcello; Valea, Emanuele. - (2022), pp. 23-24. ((Intervento presentato al convegno Dependable Systems and Networks nel 27-30 June 2022 [10.1109/DSN-S54099.2022.00017]. 1-gen-2022 Nikolaos DeligiannisRiccardo CantoroMatteo Sonza ReordaEmanuele Valea + DSN_2022.pdfImproving_the_Fault_Resilience_of_Neural_Network_Applications_Through_Security_Mechanisms.pdf