SQUILLERO, GIOVANNI

SQUILLERO, GIOVANNI  

Dipartimento di Automatica e Informatica  

003584  

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Transfer Learning in MCU Performance Screening / Bellarmino, Nicolo; Cantoro, Riccardo; Huch, Martin; Kilian, Tobias; Schlichtmann, Ulf; Squillero, Giovanni. - ELETTRONICO. - (In corso di stampa). (Intervento presentato al convegno IEEE International Test Conference (ITC 2023) tenutosi a Anaheim, CA 92802, Stati Uniti nel 8-13 Ottobre 2023). In corso di stampa Bellarmino, NicoloCantoro, RiccardoSquillero, Giovanni + 2023_XXX_Transfer_Learning_POSTER (5).pdf
A Multi-Label Active Learning Framework for Microcontroller Performance Screening / Bellarmino, Nicolo; Cantoro, Riccardo; Huch, Martin; Kilian, Tobias; Martone, Raffaele; Schlichtmann, Ulf; Squillero, Giovanni. - In: IEEE TRANSACTIONS ON COMPUTER-AIDED DESIGN OF INTEGRATED CIRCUITS AND SYSTEMS. - ISSN 0278-0070. - 42:10(2023), pp. 3436-3449. [10.1109/TCAD.2023.3245989] 1-gen-2023 Bellarmino, NicoloCantoro, RiccardoMartone, RaffaeleSquillero, Giovanni + post-print.pdfA_Multilabel_Active_Learning_Framework_for_Microcontroller_Performance_Screening.pdf
A Real-Time Novelty Recognition Framework Based on Machine Learning for Fault Detection / Albertin, Umberto; Pedone, Giuseppe; Brossa, Matilde; Squillero, Giovanni; Chiaberge, Marcello. - In: ALGORITHMS. - ISSN 1999-4893. - STAMPA. - 16:61(2023), pp. 1-26. [10.3390/a16020061] 1-gen-2023 Albertin, UmbertoPedone, GiuseppeBrossa, MatildeSquillero, GiovanniChiaberge, Marcello -
Enabling Inter-Product Transfer Learning on MCU Performance Screening / Bellarmino, Nicolo; Cantoro, Riccardo; Huch, Martin; Kilian, Tobias; Schlichtmann, Ulf; Squillero, Giovanni. - ELETTRONICO. - (2023), pp. 1-6. (Intervento presentato al convegno IEEE 32nd Asian Test Symposium tenutosi a Beijing (China) nel 14-17 October 2023) [10.1109/ATS59501.2023.10317992]. 1-gen-2023 Bellarmino, NicoloCantoro, RiccardoSquillero, Giovanni + 2023_ATS_Transfer_Learning (4) (1).pdfEnabling_Inter-Product_Transfer_Learning_on_MCU_Performance_Screening.pdf
Feature Selection for Cost Reduction in MCU Performance Screening / Bellarmino, Nicolo'; Cantoro, Riccardo; Huch, Martin; Kilian, Tobias; Schlichtmann, Ulf; Squillero, Giovanni. - (2023), pp. 1-6. (Intervento presentato al convegno 24th IEEE Latin-American Test Symposium (LATS) tenutosi a Veracruz (MEX) nel 21-24 Marzo 2023) [10.1109/LATS58125.2023.10154495]. 1-gen-2023 Bellarmino, Nicolo'Cantoro, RiccardoSquillero, Giovanni + 2023_LATS_Feature_Selection.pdfFeature_Selection_for_Cost_Reduction_In_MCU_Performance_Screening.pdf
Semi-Supervised Deep Learning for Microcontroller Performance Screening / Bellarmino, Nicolo; Cantoro, Riccardo; Huch, Martin; Kilian, Tobias; Schlichtmann, Ulf; Squillero, Giovanni. - (2023), pp. 1-6. (Intervento presentato al convegno 2023 IEEE European Test Symposium (ETS) tenutosi a Venezia (IT) nel 22-26 May 2023) [10.1109/ETS56758.2023.10174083]. 1-gen-2023 Bellarmino, NicoloCantoro, RiccardoSquillero, Giovanni + 2023_ETS_Semi_Supersived_Learning (2).pdfSemi-Supervised_Deep_Learning_for_Microcontroller_Performance_Screening.pdf
Towards Evolutionary Control Laws for Viability Problems / Tonda, Alberto; Alvarez, Isabelle; Martin, Sophie; Squillero, Giovanni; Lutton, Evelyne. - (2023), pp. 1464-1472. (Intervento presentato al convegno GECCO'23 tenutosi a Lisbon (Portugal) nel July 15 - 19, 2023) [10.1145/3583131.3590415]. 1-gen-2023 Tonda, AlbertoSquillero, Giovanni + gecco_compressed.pdf
U-FLEX: Unsupervised Feature Learning with Evolutionary eXploration / Bellarmino, Nicolo’; Cantoro, Riccardo; Squillero, Giovanni. - ELETTRONICO. - (2023). (Intervento presentato al convegno The 9th International Conference on Machine Learning, Optimization, and Data Science (LOD 2023) tenutosi a Grasmere, Lake District, England – UK nel September 22 – 26, 2023). 1-gen-2023 Nicolo’ BellarminoRiccardo CantoroGiovanni Squillero 2023_LOD_Genetic_Feature_Selection (2).pdf
Veni, Vidi, Evolvi (commentary on W. B. Langdon’s "Jaws 30") / Squillero, Giovanni; Tonda, Alberto. - In: GENETIC PROGRAMMING AND EVOLVABLE MACHINES. - ISSN 1389-2576. - 24:(2023), pp. 1-4. [10.1007/s10710-023-09472-0] 1-gen-2023 Giovanni SquilleroAlberto Tonda s10710-023-09472-0.pdf
A Virtual Sensor for Backlash in Robotic Manipulators / Giovannitti, Eliana; Nabavi, Sayyidshahab; Squillero, Giovanni; Tonda, Alberto. - In: JOURNAL OF INTELLIGENT MANUFACTURING. - ISSN 0956-5515. - STAMPA. - 33:(2022), pp. 1921-1937. [10.1007/s10845-022-01934-z] 1-gen-2022 Eliana GiovannittiGiovanni Squillero + Giovannitti_et_al-2022-Journal_of_Intelligent_Manufacturing.pdf
Machine Learning for Hardware Security: Classifier-based Identification of Trojans in Pipelined Microprocessors / Damljanovic, Aleksa; Ruospo, Annachiara; Sanchez, Ernesto; Squillero, Giovanni. - In: APPLIED SOFT COMPUTING. - ISSN 1568-4946. - ELETTRONICO. - 116:(2022), pp. 1-16. [10.1016/j.asoc.2021.108068] 1-gen-2022 Aleksa DamljanovicAnnachiara RuospoErnesto SanchezGiovanni Squillero HT_ML_Elsevier.pdf1-s2.0-S1568494621009753-main.pdf
Microcontroller Performance Screening: Optimizing the Characterization in the Presence of Anomalous and Noisy Data / Bellarmino, Nicolo'; Cantoro, Riccardo; Huch, Martin; Kilian, Tobias; Schlichtmann, Ulf; Squillero, Giovanni. - (2022). (Intervento presentato al convegno IEEE International Symposium on On-Line Testing and Robust System 2022 tenutosi a Torino nel 12-14 September 2022) [10.1109/IOLTS56730.2022.9897769]. 1-gen-2022 Bellarmino,Nicolo'Cantoro,RiccardoSquillero,Giovanni + Microcontroller_Performance_Screening_Optimizing_the_Characterization_in_the_Presence_of_Anomalous_and_Noisy_Data.pdf2022_IOLTS_Outlier_Detection_.pdf
Predictable Features Elimination: An Unsupervised Approach to Feature Selection / Barbiero, Pietro; Squillero, Giovanni; Tonda, Alberto. - STAMPA. - 13163:(2022), pp. 399-412. (Intervento presentato al convegno LOD 2021: Machine Learning, Optimization, and Data Science) [10.1007/978-3-030-95467-3_29]. 1-gen-2022 Squillero, Giovanni + 2021_LOD___Predictable_Feature_Elimination__take_3_.pdf2022 lod.pdf
Public-Private Partnership: Evolutionary Algorithms as a Solution to Information Asymmetry / Pellegrino, Simone; Rebuglio, Massimo; Squillero, Giovanni. - STAMPA. - 13224:(2022), pp. 110-123. (Intervento presentato al convegno EvoApplications 2022: Applications of Evolutionary Computation) [10.1007/978-3-031-02462-7_8]. 1-gen-2022 Rebuglio, MassimoSquillero, Giovanni + Pellegrino2022_Chapter_Public-PrivatePartnershipEvolu.pdf
Social Influence Analysis (SIA) in Online Social Networks / Leszkiewicz, Agata; Bucur, Doina; Grimme, Christian; Michalski, Radoslaw; Clever, Lena; Pohl, Janina; Rook, Jeroen; Bossek, Jakob; Preuss, Mike; Squillero, Giovanni; Quer, Stefano; Calabrese, Andrea; Iacca, Giovanni; Kizgin, Hatice; Trautmann, Heike. - ELETTRONICO. - (2022), pp. 1-2. (Intervento presentato al convegno MISDOOM 2022 tenutosi a Boise, Idaho (USA) nel 11-12 October 2022). 1-gen-2022 Giovanni SquilleroStefano QuerAndrea Calabrese + Extended_Abstract_Social_Influence_Analysis.pdf
Test, Reliability and Functional Safety trends for Automotive System-on-Chip / Angione, F.; Appello, D.; Aribido, J.; Bellarmino, N.; Bernardi, P.; Cantoro, R.; de Sio, C.; Foscale, T.; Gavarini, G.; Huch, M.; Kilian, T; Mariani, R.; Martone, R.; Ruospo, A.; Sanchez, E.; Schlichtmann, U.; Squillero, G.; Sonza Reorda, M.; Sterpone, L.; Tancorre, V.; Ugioli, R.. - (2022). (Intervento presentato al convegno IEEE European Test Symposium). 1-gen-2022 F. AngioneN. BellarminoP. BernardiR. CantoroC. de SioT. FoscaleG. GavariniA. RuospoE. SanchezG. SquilleroM. Sonza ReordaL. Sterpone + 01_ETS_special_session_ABSTRACT.pdf
Test, Reliability and Functional Safety Trends for Automotive System-on-Chip / Angione, F.; Appello, D.; Aribido, J.; Athavale, J.; Bellarmino, N.; Bernardi, P.; Cantoro, R.; De Sio, C.; Foscale, T.; Gavarini, G.; Guerrero, J.; Huch, M.; Iaria, G.; Kilian, T.; Mariani, R.; Martone, R.; Ruospo, A.; Sanchez, E.; Schlichtmann, U.; Squillero, G.; Sonza Reorda, M.; Sterpone, L.; Tancorre, V.; Ugioli, R.. - (2022), pp. 1-10. (Intervento presentato al convegno 2022 IEEE European Test Symposium (ETS) tenutosi a Barcelona (Spain) nel 23-27 May 2022) [10.1109/ETS54262.2022.9810388]. 1-gen-2022 F. AngioneN. BellarminoP. BernardiR. CantoroC. De SioT. FoscaleG. GavariniJ. GuerreroG. IariaR. MarianiA. RuospoG. SquilleroM. Sonza ReordaL. Sterpone + 2022_ETS_SpecialSession.pdfTest_Reliability_and_Functional_Safety_Trends_for_Automotive_System-on-Chip.pdf
A Benchmark Suite of RT-level Hardware Trojansfor Pipelined Microprocessor Cores / Damljanovic, Aleksa; Ruospo, Annachiara; Sanchez Sanchez, Ernesto; Squillero, Giovanni. - ELETTRONICO. - (2021). (Intervento presentato al convegno 24th IEEE International Symposium on Design and Diagnostics of Electronic Circuits and Systems (DDECS) tenutosi a Vienna, Austria nel April 7-9). 1-gen-2021 Damljanovic, AleksaRuospo, AnnachiaraSanchez Sanchez, ErnestoSquillero, Giovanni Trojan2021_DDECS_.pdf
Exploiting Active Learning for Microcontroller Performance Prediction / Bellarmino, Nicolo; Cantoro, Riccardo; Huch, Martin; Kilian, Tobias; Martone, Raffaele; Schlichtmann, Ulf; Squillero, Giovanni. - ELETTRONICO. - (2021), pp. 1-4. (Intervento presentato al convegno 2021 IEEE European Test Symposium nel 24-28 May 2021) [10.1109/ETS50041.2021.9465472]. 1-gen-2021 Bellarmino, NicoloCantoro, RiccardoSquillero, Giovanni + ETS21___Speed_Monitors__Camera_ready.pdfExploiting_Active_Learning_for_Microcontroller_Performance_Prediction.pdf
Exploiting Artificial Swarms for the Virtual Measurement of Backlash in Industrial Robots / Squillero, Giovanni; Giovannitti, Eliana; Tonda, Alberto; Nabavi, Sayyidshahab. - ELETTRONICO. - (2021), pp. 1743-1750. (Intervento presentato al convegno IEEE Congress on Evolutionary Computation 2021 tenutosi a Kraków, Poland nel 28 June 2021 - 01 July 2021) [10.1109/CEC45853.2021.9504962]. 1-gen-2021 Squillero, GiovanniGiovannitti, ElianaTonda,Alberto + 2021078038.pdfExploiting_Artificial_Swarms_for_the_Virtual_Measurement_of_Backlash_in_Industrial_Robots.pdf