Archivio Istituzionale della RicercaBERNARDI, PAOLO
BERNARDI, PAOLO
Dipartimento di Automatica e Informatica
012326
A guided debugger-based fault injection methodology for assessing functional test programs
2023 Angione, Francesco; Bernardi, Paolo; Di Gruttola Giardino, Nicola; Appello, Davide; Bertani, Claudia; Tancorre, Vincenzo
A Novel Approach to Extract Embedded Memory Design Parameter Through Irradiation Test
2023 Bernardi, Paolo; Kolahimahmoudi, Nima; Insinga, Giorgio
About the correlation between logical identified faulty gates and their layout characteristics
2023 Bernardi, Paolo; Cardone, Lorenzo; Iaria, Giusy; Appello, Davide; Garozzo, Giuseppe; Tancorre, Vincenzo
Collecting diagnostic information through dichotomic search from Logic BIST of failing in-field automotive SoCs with delay faults
2023 Bernardi, Paolo; Filipponi, Gabriele; Reorda, Matteo Sonza; Appello, Davide; Bertani, Claudia; Tancorre, Vincenzo
Low cost external serial interface watchdog for SoCs and FPGAs automatic characterization tests
2023 Bernardi, Paolo; Filipponi, Gabriele; Foscale, Tommaso; Insinga, Giorgio
On the integration and hardening of Software Test Libraries in Real-Time Operating Systems
2023 Angione, Francesco; Bernardi, Paolo; Cantoro, Riccardo; Di Gruttola Giardino, Nicola; Piumatti, Davide; Reorda, Matteo Sonza; Appello, Davide; Tancorre, Vincenzo
A novel Pattern Selection Algorithm to reduce the Test Cost of large Automotive Systems-on-Chip
2022 Iaria, Giusy; Angione, Francesco; Bernardi, Paolo; SONZA REORDA, Matteo; Davide, Appello; Giuseppe, Garozzo; Vincenzo, Tancorre
A novel SEU injection setup for Automotive SoC
2022 Iaria, G.; Foscale, T.; Bernardi, P.; Presicce, L.; Sonza Reorda, M.; Appello, D.; Tancorre, V.; Ugioli, R.
An innovative Strategy to Quickly Grade Functional Test Programs
2022 Angione, Francesco; Bernardi, Paolo; Calabrese, Andrea; Cardone, Lorenzo; Niccoletti, Alessandro; Piumatti, Davide; Quer, Stefano; Appello, Davide; Tancorre, Vincenzo; Ugioli, Roberto
An Optimized Burn-In Stress Flow targeting Interconnections logic to Embedded Memories in Automotive Systems-on-Chip
2022 Angione, Francesco; Bernardi, Paolo; Filipponi, Gabriele; SONZA REORDA, Matteo; Appello, Davide; Tancorre, Vincenzo; Ugioli, Roberto
Online scheduling of concurrent Memory BISTs execution at Real-Time Operating-System level
2022 Angione, Francesco; Bernardi, Paolo; Filipponi, Gabriele; Tempesta, Claudia; SONZA REORDA, Matteo; Appello, Davide; Ugioli, Roberto; Tancorre, Vincenzo
Optimized diagnostic strategy for embedded memories of Automotive Systems-on-Chip
2022 Bernardi, Paolo; Insinga, Giorgio; Paganini, Giovanni; Cantoro, Riccardo; Beer, Peter; Mautone, Nellina; Scaramuzza, Pierre; Carnevale, Giambattista; Coppetta, Matteo; Ullmann, Rudolf
Recent Trends and Perspectives on Defect-Oriented Testing
2022 Bernardi, P.; Cantoro, R.; Coyette, A.; Dobbeleare, W.; Fieback, M.; Floridia, A.; Gielen, G.; Gomez, J.; Grosso, M.; Guerriero, A. M.; Guglielminetti, I.; Hamdioui, S.; Insinga, G.; Mautone, N.; Mirabella, N.; Sartoni, S.; Sonza Reorda, M.; Ullmann, R.; Vanhooren, R.; Xama, N.; Wu, L.
Test, Reliability and Functional Safety trends for Automotive System-on-Chip
2022 Angione, F.; Appello, D.; Aribido, J.; Bellarmino, N.; Bernardi, P.; Cantoro, R.; de Sio, C.; Foscale, T.; Gavarini, G.; Huch, M.; Kilian, T; Mariani, R.; Martone, R.; Ruospo, A.; Sanchez, E.; Schlichtmann, U.; Squillero, G.; Sonza Reorda, M.; Sterpone, L.; Tancorre, V.; Ugioli, R.
Test, Reliability and Functional Safety Trends for Automotive System-on-Chip
2022 Angione, F.; Appello, D.; Aribido, J.; Athavale, J.; Bellarmino, N.; Bernardi, P.; Cantoro, R.; De Sio, C.; Foscale, T.; Gavarini, G.; Guerrero, J.; Huch, M.; Iaria, G.; Kilian, T.; Mariani, R.; Martone, R.; Ruospo, A.; Sanchez, E.; Schlichtmann, U.; Squillero, G.; Sonza Reorda, M.; Sterpone, L.; Tancorre, V.; Ugioli, R.
Accelerated Analysis of Simulation Dumps through Parallelization on Multicore Architectures
2021 Appello, D.; Bernardi, P.; Calabrese, A.; Littardi, S.; Pollaccia, G.; Quer, S.; Tancorre, V.; Ugioli, R.
Industrial best practice: cases of study by automotive chip- makers
2021 Abbati, L. Degli; Ullmann, R.; Paganini, G.; Coppetta, M.; Zaia, L.; Huard, V.; Montfort, O.; Cantoro, R.; Insinga, G.; Venini, F.; Calao, P.; Bernardi, P.
Innovative methods for Burn-In related Stress Metrics Computation
2021 Ruggeri, Walter; Bernardi, Paolo; Littardi, Stefano; Reorda, Matteo Sonza; Appello, Davide; Bertani, Claudia; Pollaccia, Giorgio; Tancorre, Vincenzo; Ugioli, Roberto
System-Level Test: State of the Art and Challenges
2021 Appello, D.; Chen, H. H.; Sauer, M.; Polian, I.; Bernardi, P.; Reorda, M. S.
Accelerated Analysis of Simulation Dumps through Parallelization on Multicore Architectures
2020 Calabrese, A.; Bernardi, P.; Littardi, S.; Quer, S.
| Citazione | Data di pubblicazione | Autori | File |
|---|---|---|---|
| A guided debugger-based fault injection methodology for assessing functional test programs / Angione, Francesco; Bernardi, Paolo; Di Gruttola Giardino, Nicola; Appello, Davide; Bertani, Claudia; Tancorre, Vincenzo. - (2023), pp. 1-7. (Intervento presentato al convegno VLSI Test Symposium tenutosi a San Diego (USA) nel 24-26 April 2023) [10.1109/VTS56346.2023.10140099]. | 1-gen-2023 | Angione, FrancescoBernardi, PaoloDi Gruttola Giardino, Nicola + | A_guided_debugger-based_fault_injection_methodology_for_assessing_functional_test_programs.pdf |
| A Novel Approach to Extract Embedded Memory Design Parameter Through Irradiation Test / Bernardi, Paolo; Kolahimahmoudi, Nima; Insinga, Giorgio. - (2023), pp. 1-6. (Intervento presentato al convegno Conference on Very Large Scale Integration (VLSI-SoC 2023) tenutosi a Dubai (United Arab Emirates) nel October 16 - 18, 2023) [10.1109/VLSI-SoC57769.2023.10321848]. | 1-gen-2023 | Bernardi, PaoloKolahimahmoudi, NimaInsinga, Giorgio | A_Novel_Approach_to_Extract_Embedded_Memory_Design_Parameter_Through_Irradiation_Test.pdf; A_Novel_Approach_to_Extract_Embedded_Memory_Design_Parameter_Through_Irradiation_Test.pdf |
| About the correlation between logical identified faulty gates and their layout characteristics / Bernardi, Paolo; Cardone, Lorenzo; Iaria, Giusy; Appello, Davide; Garozzo, Giuseppe; Tancorre, Vincenzo. - (2023). (Intervento presentato al convegno IEEE International Symposium on On-Line Testing and Robust System Design tenutosi a 03-05 July 2023 nel Crete, Greece) [10.1109/IOLTS59296.2023.10224897]. | 1-gen-2023 | Bernardi, PaoloCardone, LorenzoIaria, Giusy + | IOLTS_2023_FaultsLayoutAnalysis (4).pdf; About_the_Correlation_between_Logical_Identified_Faulty_Gates_and_their_Layout_Characteristics.pdf |
| Collecting diagnostic information through dichotomic search from Logic BIST of failing in-field automotive SoCs with delay faults / Bernardi, Paolo; Filipponi, Gabriele; Reorda, Matteo Sonza; Appello, Davide; Bertani, Claudia; Tancorre, Vincenzo. - ELETTRONICO. - (2023), pp. 21-26. (Intervento presentato al convegno International Symposium on Design and Diagnostics of Electronic Circuits and Systems tenutosi a Tallinn (Estonia) nel 03-05 May 2023) [10.1109/DDECS57882.2023.10139670]. | 1-gen-2023 | Bernardi, PaoloFilipponi, GabrieleReorda, Matteo Sonza + | 2023058710.pdf; Collecting_diagnostic_information_through_dichotomic_search_from_Logic_BIST_of_failing_in-field_automotive_SoCs_with_delay_faults.pdf |
| Low cost external serial interface watchdog for SoCs and FPGAs automatic characterization tests / Bernardi, Paolo; Filipponi, Gabriele; Foscale, Tommaso; Insinga, Giorgio. - (2023). (Intervento presentato al convegno IEEE Latin-American Test Symposium tenutosi a Veracruz (Mexico) nel 21-24 March 2023) [10.1109/LATS58125.2023.10154486]. | 1-gen-2023 | Bernardi, PaoloFilipponi, GabrieleFoscale, TommasoInsinga, Giorgio | LATS_2023.pdf; Low_cost_external_serial_interface_watchdog_for_SoCs_and_FPGAs_automatic_characterization_tests.pdf |
| On the integration and hardening of Software Test Libraries in Real-Time Operating Systems / Angione, Francesco; Bernardi, Paolo; Cantoro, Riccardo; Di Gruttola Giardino, Nicola; Piumatti, Davide; Reorda, Matteo Sonza; Appello, Davide; Tancorre, Vincenzo. - (2023), pp. 1-6. (Intervento presentato al convegno Latin American Test Symposium tenutosi a Veracruz (Mexico) nel 21-24 March 2023) [10.1109/LATS58125.2023.10154492]. | 1-gen-2023 | Angione, FrancescoBernardi, PaoloCantoro, RiccardoDi Gruttola Giardino, NicolaPiumatti, DavideReorda, Matteo Sonza + | On_the_integration_and_hardening_of_Software_Test_Libraries_in_Real-Time_Operating_Systems.pdf |
| A novel Pattern Selection Algorithm to reduce the Test Cost of large Automotive Systems-on-Chip / Iaria, Giusy; Angione, Francesco; Bernardi, Paolo; SONZA REORDA, Matteo; Davide, Appello; Giuseppe, Garozzo; Vincenzo, Tancorre. - (2022). (Intervento presentato al convegno Latin American Test Symposium tenutosi a Montevideo (Uruguay) nel 05-08 September 2022) [10.1109/LATS57337.2022.9936975]. | 1-gen-2022 | Iaria GiusyFrancesco AngionePaolo BernardiMatteo Sonza Reorda + | A_novel_Pattern_Selection_Algorithm_to_reduce_the_Test_Cost_of_large_Automotive_Systems-on-Chip.pdf |
| A novel SEU injection setup for Automotive SoC / Iaria, G.; Foscale, T.; Bernardi, P.; Presicce, L.; Sonza Reorda, M.; Appello, D.; Tancorre, V.; Ugioli, R.. - (2022), pp. 623-626. (Intervento presentato al convegno 2022 IEEE International Symposium on Industrial Electronics tenutosi a Anchorage, AK (USA) nel 01-03 June 2022) [10.1109/ISIE51582.2022.9831533]. | 1-gen-2022 | G. IariaT. FoscaleP. BernardiL. PresicceM. Sonza Reorda + | A_novel_SEU_injection_setup_for_Automotive_SoC.pdf |
| An innovative Strategy to Quickly Grade Functional Test Programs / Angione, Francesco; Bernardi, Paolo; Calabrese, Andrea; Cardone, Lorenzo; Niccoletti, Alessandro; Piumatti, Davide; Quer, Stefano; Appello, Davide; Tancorre, Vincenzo; Ugioli, Roberto. - (2022), pp. 355-364. (Intervento presentato al convegno International Test Conference tenutosi a Anaheim, CA (USA) nel 23-30 September 2022) [10.1109/ITC50671.2022.00044]. | 1-gen-2022 | Francesco AngionePaolo BernardiAndrea CalabreseLorenzo CardoneDavide PiumattiStefano Quer + | An_innovative_Strategy_to_Quickly_Grade_Functional_Test_Programs.pdf |
| An Optimized Burn-In Stress Flow targeting Interconnections logic to Embedded Memories in Automotive Systems-on-Chip / Angione, Francesco; Bernardi, Paolo; Filipponi, Gabriele; SONZA REORDA, Matteo; Appello, Davide; Tancorre, Vincenzo; Ugioli, Roberto. - (2022), pp. 1-6. (Intervento presentato al convegno IEEE European Test Symposium tenutosi a Barcelona (Spain) nel 23-27 May 2022) [10.1109/ETS54262.2022.9810396]. | 1-gen-2022 | Francesco ANGIONEPaolo BERNARDIGabriele FILIPPONIMatteo SONZA REORDA + | An_Optimized_Burn-In_Stress_Flow_targeting_Interconnections_logic_to_Embedded_Memories_in_Automotive_Systems-on-Chip.pdf |
| Online scheduling of concurrent Memory BISTs execution at Real-Time Operating-System level / Angione, Francesco; Bernardi, Paolo; Filipponi, Gabriele; Tempesta, Claudia; SONZA REORDA, Matteo; Appello, Davide; Ugioli, Roberto; Tancorre, Vincenzo. - (2022). (Intervento presentato al convegno International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems tenutosi a Austin (USA) nel 19-21 October 2022) [10.1109/DFT56152.2022.9962338]. | 1-gen-2022 | Francesco AngionePaolo BernardiGabriele FilipponiClaudia TempestaMatteo Sonza Reorda + | Online_scheduling_of_concurrent_Memory_BISTs_execution_at_Real-Time_Operating-System_level.pdf |
| Optimized diagnostic strategy for embedded memories of Automotive Systems-on-Chip / Bernardi, Paolo; Insinga, Giorgio; Paganini, Giovanni; Cantoro, Riccardo; Beer, Peter; Mautone, Nellina; Scaramuzza, Pierre; Carnevale, Giambattista; Coppetta, Matteo; Ullmann, Rudolf. - (2022), pp. 1-6. (Intervento presentato al convegno IEEE European Test Symposium tenutosi a Barcelona (Spain) nel 23-27 May 2022) [10.1109/ETS54262.2022.9810445]. | 1-gen-2022 | Paolo BERNARDIGiorgio INSINGAGiovanni PAGANINIRiccardo CANTORO + | Optimized_diagnostic_strategy_for_embedded_memories_of_Automotive_Systems-on-Chip.pdf |
| Recent Trends and Perspectives on Defect-Oriented Testing / Bernardi, P.; Cantoro, R.; Coyette, A.; Dobbeleare, W.; Fieback, M.; Floridia, A.; Gielen, G.; Gomez, J.; Grosso, M.; Guerriero, A. M.; Guglielminetti, I.; Hamdioui, S.; Insinga, G.; Mautone, N.; Mirabella, N.; Sartoni, S.; Sonza Reorda, M.; Ullmann, R.; Vanhooren, R.; Xama, N.; Wu, L.. - (2022). (Intervento presentato al convegno The 28th IEEE International Symposium on On-Line Testing and Robust System Design (IOLTS) tenutosi a Torino (Italy) nel 12-14 September 2022) [10.1109/IOLTS56730.2022.9897647]. | 1-gen-2022 | P. BernardiR. CantoroA. FloridiaM. GrossoS. HamdiouiG. InsingaN. MirabellaS. SartoniM. Sonza ReordaL. Wu + | _IOLTS2022__Special_Session__Recent_Trends_and_Perspectives_on_Defect_Oriented_Testing.pdf; Recent_Trends_and_Perspectives_on_Defect-Oriented_Testing.pdf |
| Test, Reliability and Functional Safety trends for Automotive System-on-Chip / Angione, F.; Appello, D.; Aribido, J.; Bellarmino, N.; Bernardi, P.; Cantoro, R.; de Sio, C.; Foscale, T.; Gavarini, G.; Huch, M.; Kilian, T; Mariani, R.; Martone, R.; Ruospo, A.; Sanchez, E.; Schlichtmann, U.; Squillero, G.; Sonza Reorda, M.; Sterpone, L.; Tancorre, V.; Ugioli, R.. - (2022). (Intervento presentato al convegno IEEE European Test Symposium). | 1-gen-2022 | F. AngioneN. BellarminoP. BernardiR. CantoroC. de SioT. FoscaleG. GavariniA. RuospoE. SanchezG. SquilleroM. Sonza ReordaL. Sterpone + | 01_ETS_special_session_ABSTRACT.pdf |
| Test, Reliability and Functional Safety Trends for Automotive System-on-Chip / Angione, F.; Appello, D.; Aribido, J.; Athavale, J.; Bellarmino, N.; Bernardi, P.; Cantoro, R.; De Sio, C.; Foscale, T.; Gavarini, G.; Guerrero, J.; Huch, M.; Iaria, G.; Kilian, T.; Mariani, R.; Martone, R.; Ruospo, A.; Sanchez, E.; Schlichtmann, U.; Squillero, G.; Sonza Reorda, M.; Sterpone, L.; Tancorre, V.; Ugioli, R.. - (2022), pp. 1-10. (Intervento presentato al convegno 2022 IEEE European Test Symposium (ETS) tenutosi a Barcelona (Spain) nel 23-27 May 2022) [10.1109/ETS54262.2022.9810388]. | 1-gen-2022 | F. AngioneN. BellarminoP. BernardiR. CantoroC. De SioT. FoscaleG. GavariniJ. GuerreroG. IariaR. MarianiA. RuospoG. SquilleroM. Sonza ReordaL. Sterpone + | 2022_ETS_SpecialSession.pdf; Test_Reliability_and_Functional_Safety_Trends_for_Automotive_System-on-Chip.pdf |
| Accelerated Analysis of Simulation Dumps through Parallelization on Multicore Architectures / Appello, D.; Bernardi, P.; Calabrese, A.; Littardi, S.; Pollaccia, G.; Quer, S.; Tancorre, V.; Ugioli, R.. - (2021), pp. 69-74. (Intervento presentato al convegno 24th International Symposium on Design and Diagnostics of Electronic Circuits and Systems, DDECS 2021 tenutosi a aut nel 2021) [10.1109/DDECS52668.2021.9417048]. | 1-gen-2021 | Bernardi P.Calabrese A.Littardi S.Quer S. + | 09417048.pdf |
| Industrial best practice: cases of study by automotive chip- makers / Abbati, L. Degli; Ullmann, R.; Paganini, G.; Coppetta, M.; Zaia, L.; Huard, V.; Montfort, O.; Cantoro, R.; Insinga, G.; Venini, F.; Calao, P.; Bernardi, P.. - (2021), pp. 1-6. (Intervento presentato al convegno 2021 IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems (DFT) nel 06-08 October 2021) [10.1109/DFT52944.2021.9568350]. | 1-gen-2021 | Paganini, G.Cantoro, R.Insinga, G.Venini, F.Calao, P.Bernardi, P. + | Industrial_best_practice_cases_of_study_by_automotive_chip-_makers.pdf |
| Innovative methods for Burn-In related Stress Metrics Computation / Ruggeri, Walter; Bernardi, Paolo; Littardi, Stefano; Reorda, Matteo Sonza; Appello, Davide; Bertani, Claudia; Pollaccia, Giorgio; Tancorre, Vincenzo; Ugioli, Roberto. - ELETTRONICO. - (2021), pp. 1-6. (Intervento presentato al convegno 16th International Conference on Design & Technology of Integrated Systems in Nanoscale Era (DTIS) nel 28-30 June 2021) [10.1109/DTIS53253.2021.9505067]. | 1-gen-2021 | Ruggeri, WalterBernardi, PaoloLittardi, StefanoReorda, Matteo Sonza + | innovative_methods_for_burn-in_related_stress_metrics_computation.pdf; Innovative_methods_for_Burn-In_related_Stress_Metrics_Computation.pdf |
| System-Level Test: State of the Art and Challenges / Appello, D.; Chen, H. H.; Sauer, M.; Polian, I.; Bernardi, P.; Reorda, M. S.. - (2021), pp. 1-7. (Intervento presentato al convegno 27th IEEE International Symposium on On-Line Testing and Robust System Design, IOLTS 2021 nel 2021) [10.1109/IOLTS52814.2021.9486708]. | 1-gen-2021 | Bernardi P.Reorda M. S. + | System-Level_Test_State_of_the_Art_and_Challenges.pdf |
| Accelerated Analysis of Simulation Dumps through Parallelization on Multicore Architectures / Calabrese, A.; Bernardi, P.; Littardi, S.; Quer, S.. - ELETTRONICO. - (2020), pp. 1-1. (Intervento presentato al convegno International Test Conference 2020 (ITC2020) nel 3-5 November 2020). | 1-gen-2020 | A. CalabreseP. BernardiS. LittardiS. Quer | poster.pdf |