Archivio Istituzionale della RicercaSfoglia per Autore
PyXEL: An Integrated Environment for the Analysis of Fault Effects in SRAM-Based FPGA Routing
2018 Bozzoli, Ludovica; DE SIO, Corrado; Sterpone, Luca; Bernardeschi, Cinzia
A new Method for the Analysis of Radiation-induced Effects in 3D VLSI Face-to-Back LUTs
2019 Sterpone, Luca; Bozzoli, Ludovica; DE SIO, Corrado; Du, Boyang; Azimi, Sarah
On the Evaluation of the PIPB Effect within SRAM-based FPGAs
2019 DE SIO, Corrado; Azimi, Sarah; Sterpone, Luca
A new FPGA-based Detection Method for Spurious Variations in PCBA Power Distribution Network
2019 Odintsov, Sergei; Bozzoli, Ludovica; De Sio, Corrado; Sterpone, Luca; Jutman, Artur
Analysis of Radiation-induced SETs in 3D VLSI Face-to-Back LUTs
2019 Sterpone, Luca; Bozzoli, Ludovica; DE SIO, Corrado; Du, Boyang; Azimi, Sarah
Radiation-induced Single Event Transient effects during the reconfiguration process of SRAM-based FPGAs
2019 De Sio, C.; Azimi, S.; Bozzoli, L.; Du, B.; Sterpone, L.
Analyzing Radiation-induced Transient Errors on SRAM-based FPGAs by Propagation of Broadening Effect
2019 DE SIO, Corrado; Azimi, Sarah; Sterpone, Luca; Du, Boyang
On the Reliability of Convolutional Neural Network Implementation on SRAM-based FPGA
2019 Du, Boyang; Azimi, Sarah; DE SIO, Corrado; Bozzoli, Ludovica; Sterpone, Luca
In-Circuit Mitigation Approach of Single Event Transients for 45nm Flip-Flops
2020 Azimi, Sarah; De Sio, Corrado; Sterpone, Luca
A New Single Event Transient Hardened Floating Gate Configurable Logic Circuit
2020 Azimi, Sarah; DE SIO, Corrado; Yang, Weitao; Sterpone, Luca
On the evaluation of SEU effects on AXI interconnect within AP-SoCs
2020 De Sio, C.; Azimi, S.; Sterpone, L.
On the Analysis of Radiation-induced Failures in the AXI Interconnect Module
2020 De Sio, C.; Azimi, S.; Sterpone, L.
An Emulation Platform for Evaluating the Reliability of Deep Neural Networks
2020 DE SIO, Corrado; Azimi, Sarah; Sterpone, Luca
On the Mitigation of Single Event Transient in 3D LUT by In-Cell Layout Resizing
2020 Azimi, Sarah; Du, Boyang; DE SIO, Corrado; Sterpone, Luca
On the Evaluation of SEEs on Open-Source Embedded Static RAMs
2021 Azimi, Sarah; De Sio, Corrado; Sterpone, Luca
A 3-D LUT Design for Transient Error Detection Via Inter-Tier In-Silicon Radiation Sensor
2021 Azimi, Sarah; DE SIO, Corrado; Sterpone, Luca
A Radiation-Hardened CMOS Full-Adder Based on Layout Selective Transistor Duplication
2021 Azimi, Sarah; De Sio, Corrado; Sterpone, Luca
A Neutron Generator Testing Platform for the Radiation Analysis of SRAM-based FPGAs
2021 Bozzoli, L.; De Sio, C.; Du, B.; Sterpone, L.
Single-event-effect propagation investigation on nanoscale system on chip by applying heavy-ion microbeam and event tree analysis
2021 Yang, Wei-Tao; Du, Xue-Cheng; Li, Yong-Hong; He, Chao-Hui; Guo, Gang; Shi, Shu-Ting; Cai, Li; Azimi, Sarah; De Sio, Corrado; Sterpone, Luca
A New Domains-based Isolation Design Flow for Reconfigurable SoCs
2021 Portaluri, Andrea; De Sio, Corrado; Azimi, Sarah; Sterpone, Luca
| Citazione | Data di pubblicazione | Autori | File |
|---|---|---|---|
| PyXEL: An Integrated Environment for the Analysis of Fault Effects in SRAM-Based FPGA Routing / Bozzoli, Ludovica; DE SIO, Corrado; Sterpone, Luca; Bernardeschi, Cinzia. - (2018), pp. 70-75. (Intervento presentato al convegno 2018 International Symposium on Rapid System Prototyping (RSP)) [10.1109/RSP.2018.8632000]. | 1-gen-2018 | Bozzoli, LudovicaDE SIO, CORRADOSterpone, Luca + | - |
| A new Method for the Analysis of Radiation-induced Effects in 3D VLSI Face-to-Back LUTs / Sterpone, Luca; Bozzoli, Ludovica; DE SIO, Corrado; Du, Boyang; Azimi, Sarah. - ELETTRONICO. - (2019), pp. 205-208. (Intervento presentato al convegno IEEE International Conference on Synthesis, modeling, analysis and Simulation methods and applications to circuit design (SMACD)) [10.1109/SMACD.2019.8795296]. | 1-gen-2019 | Luca SterponeLudovica BozzoliCorrado De SioBoyang DuSarah Azimi | SMACD2019.pdf; A_new_Method_for_the_Analysis_of_Radiation-induced_Effects_in_3D_VLSI_Face-to-Back_LUTs.pdf |
| On the Evaluation of the PIPB Effect within SRAM-based FPGAs / DE SIO, Corrado; Azimi, Sarah; Sterpone, Luca. - (2019). (Intervento presentato al convegno 2019 IEEE European Test Symposium (ETS2019)) [10.1109/ETS.2019.8791527]. | 1-gen-2019 | Corrado de sioSarah AzimiLuca sterpone | ETS_CAMERAREADY.pdf; On_the_Evaluation_of_the_PIPB_Effect_within_SRAM-based_FPGAs.pdf |
| A new FPGA-based Detection Method for Spurious Variations in PCBA Power Distribution Network / Odintsov, Sergei; Bozzoli, Ludovica; De Sio, Corrado; Sterpone, Luca; Jutman, Artur. - (2019), pp. 1-6. (Intervento presentato al convegno IEEE DDECS 2019) [10.1109/DDECS.2019.8724662]. | 1-gen-2019 | Bozzoli, LudovicaDe Sio, CorradoSterpone, Luca + | - |
| Analysis of Radiation-induced SETs in 3D VLSI Face-to-Back LUTs / Sterpone, Luca; Bozzoli, Ludovica; DE SIO, Corrado; Du, Boyang; Azimi, Sarah. - (2019). (Intervento presentato al convegno 30th IEEE Radiation and its Effects on Components and Systems (RADECS 2019)). | 1-gen-2019 | Luca SterponeLudovica BozzoliCorrado De SioBoyang DuSarah Azimi | - |
| Radiation-induced Single Event Transient effects during the reconfiguration process of SRAM-based FPGAs / De Sio, C.; Azimi, S.; Bozzoli, L.; Du, B.; Sterpone, L.. - In: MICROELECTRONICS RELIABILITY. - ISSN 0026-2714. - ELETTRONICO. - (2019). [10.1016/j.microrel.2019.06.034] | 1-gen-2019 | De Sio, C.Azimi, S.Bozzoli, L.Du, B.Sterpone, L. | - |
| Analyzing Radiation-induced Transient Errors on SRAM-based FPGAs by Propagation of Broadening Effect / DE SIO, Corrado; Azimi, Sarah; Sterpone, Luca; Du, Boyang. - In: IEEE ACCESS. - ISSN 2169-3536. - 7:(2019), pp. 140182-140189. [10.1109/ACCESS.2019.2915136] | 1-gen-2019 | Corrado De SioSarah AzimiLuca SterponeBoyang Du | 08708270.pdf |
| On the Reliability of Convolutional Neural Network Implementation on SRAM-based FPGA / Du, Boyang; Azimi, Sarah; DE SIO, Corrado; Bozzoli, Ludovica; Sterpone, Luca. - ELETTRONICO. - (2019). (Intervento presentato al convegno The 32nd IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology tenutosi a ESA-ESTEC & TU Delft, Netherlands nel 02/10/2019 - 04/10/2019) [10.1109/DFT.2019.8875362]. | 1-gen-2019 | Boyang DuSarah AzimiCorrado De SioLudovica BozzoliLuca Sterpone | 08875362.pdf |
| In-Circuit Mitigation Approach of Single Event Transients for 45nm Flip-Flops / Azimi, Sarah; De Sio, Corrado; Sterpone, Luca. - ELETTRONICO. - (2020), pp. 1-6. (Intervento presentato al convegno 26th IEEE International Symposium on On-Line Testing and robust System Design (IOLT 2020) nel 13-15 July 2020) [10.1109/IOLTS50870.2020.9159738]. | 1-gen-2020 | Azimi, SarahDe Sio, CorradoSterpone, Luca | IOLTS2020_CameraReady.pdf; In-Circuit_Mitigation_Approach_of_Single_Event_Transients_for_45nm_Flip-Flops.pdf |
| A New Single Event Transient Hardened Floating Gate Configurable Logic Circuit / Azimi, Sarah; DE SIO, Corrado; Yang, Weitao; Sterpone, Luca. - ELETTRONICO. - (2020), pp. 311-314. (Intervento presentato al convegno 18th IEEE International NEWCAS tenutosi a Montreal, Canada nel June 16-19, 2020) [10.1109/NEWCAS49341.2020.9159844]. | 1-gen-2020 | Sarah AzimiCorrado De SioWeitao YangLuca Sterpone | NEWCAS_2020.pdf; 09159844.pdf |
| On the evaluation of SEU effects on AXI interconnect within AP-SoCs / De Sio, C.; Azimi, S.; Sterpone, L.. - 12155:(2020), pp. 215-227. (Intervento presentato al convegno 33rd International Conference on Architecture of Computing Systems, ARCS 2020 tenutosi a deu nel 2020) [10.1007/978-3-030-52794-5_16]. | 1-gen-2020 | De Sio C.Azimi S.Sterpone L. | ARCS2020_CameraReady.pdf; Sio2020_Chapter_OnTheEvaluationOfSEUEffectsOnA.pdf |
| On the Analysis of Radiation-induced Failures in the AXI Interconnect Module / De Sio, C.; Azimi, S.; Sterpone, L.. - In: MICROELECTRONICS RELIABILITY. - ISSN 0026-2714. - ELETTRONICO. - 114:(2020), p. 113733. [10.1016/j.microrel.2020.113733] | 1-gen-2020 | De Sio C.Azimi S.Sterpone L. | MicRel2020_CameraReady.pdf; 1-s2.0-S0026271420305400-main.pdf |
| An Emulation Platform for Evaluating the Reliability of Deep Neural Networks / DE SIO, Corrado; Azimi, Sarah; Sterpone, Luca. - ELETTRONICO. - (2020), pp. 1-4. (Intervento presentato al convegno 33rd IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems (DFT 2020) tenutosi a ita nel 19-21 Oct. 2020) [10.1109/DFT50435.2020.9250872]. | 1-gen-2020 | Corrado De SioSarah AzimiLuca Sterpone | DFT_CameaReady_FinalVersion.pdf; 09250872.pdf |
| On the Mitigation of Single Event Transient in 3D LUT by In-Cell Layout Resizing / Azimi, Sarah; Du, Boyang; DE SIO, Corrado; Sterpone, Luca. - ELETTRONICO. - (2020), pp. 1-4. (Intervento presentato al convegno European Conference on Radiation and its Effects on Components and Systems (RADECS) tenutosi a Online event) [10.1109/RADECS50773.2020.9857719]. | 1-gen-2020 | Sarah AzimiBoyang DuCorrado De SioLuca Sterpone | RADECS2020_CameraReady.pdf; On_the_Mitigation_of_Single_Event_Transient_in_3D_LUT_by_In-Cell_Layout_Resizing.pdf |
| On the Evaluation of SEEs on Open-Source Embedded Static RAMs / Azimi, Sarah; De Sio, Corrado; Sterpone, Luca. - ELETTRONICO. - (2021), pp. 1-6. (Intervento presentato al convegno IEEE International Conference on Very Large Scale Integration (VLSI-SoC) nel 4-7 October 2021) [10.1109/VLSI-SoC53125.2021.9606985]. | 1-gen-2021 | Azimi, SarahDe Sio, CorradoSterpone, Luca | VLSI-SoC Camera Ready.pdf; On_the_Evaluation_of_SEEs_on_Open-Source_Embedded_Static_RAMs.pdf |
| A 3-D LUT Design for Transient Error Detection Via Inter-Tier In-Silicon Radiation Sensor / Azimi, Sarah; DE SIO, Corrado; Sterpone, Luca. - ELETTRONICO. - (2021), pp. 252-257. (Intervento presentato al convegno Design, Automation and Test in Europe Conference (DATE2021) nel 01-05 February 2021) [10.23919/DATE51398.2021.9473944]. | 1-gen-2021 | Sarah AzimiCorrado De SioLuca Sterpone | DATE 2021- Camera Ready.pdf; A_3-D_LUT_Design_for_Transient_Error_Detection_Via_Inter-Tier_In-Silicon_Radiation_Sensor.pdf |
| A Radiation-Hardened CMOS Full-Adder Based on Layout Selective Transistor Duplication / Azimi, Sarah; De Sio, Corrado; Sterpone, Luca. - In: IEEE TRANSACTIONS ON VERY LARGE SCALE INTEGRATION (VLSI) SYSTEMS. - ISSN 1063-8210. - ELETTRONICO. - 29:8(2021), pp. 1596-1600. [10.1109/TVLSI.2021.3086897] | 1-gen-2021 | Azimi, SarahDe Sio, CorradoSterpone, Luca | ToVLSI-Final Version.pdf; A_Radiation-Hardened_CMOS_Full-Adder_Based_on_Layout_Selective_Transistor_Duplication.pdf |
| A Neutron Generator Testing Platform for the Radiation Analysis of SRAM-based FPGAs / Bozzoli, L.; De Sio, C.; Du, B.; Sterpone, L.. - ELETTRONICO. - (2021), pp. 1-5. (Intervento presentato al convegno IEEE International Instrumentation and Measurement Technology Conference (I2MTC) tenutosi a Glasgow, United Kingdom nel 17-20 May 2021) [10.1109/I2MTC50364.2021.9459804]. | 1-gen-2021 | L. BozzoliC. De SioB. DuL. Sterpone | 09459804.pdf |
| Single-event-effect propagation investigation on nanoscale system on chip by applying heavy-ion microbeam and event tree analysis / Yang, Wei-Tao; Du, Xue-Cheng; Li, Yong-Hong; He, Chao-Hui; Guo, Gang; Shi, Shu-Ting; Cai, Li; Azimi, Sarah; De Sio, Corrado; Sterpone, Luca. - In: NUCLEAR SCIENCE AND TECHNIQUES. - ISSN 1001-8042. - 32:10(2021). [10.1007/s41365-021-00943-6] | 1-gen-2021 | Azimi, SarahDe Sio, CorradoSterpone, Luca + | Yang2021_Article_Single-event-effectPropagation (1).pdf |
| A New Domains-based Isolation Design Flow for Reconfigurable SoCs / Portaluri, Andrea; De Sio, Corrado; Azimi, Sarah; Sterpone, Luca. - ELETTRONICO. - (2021), pp. 1-7. (Intervento presentato al convegno IEEE International Symposium on On-Line Testing and robust System Design (IOLTS 2021)) [10.1109/IOLTS52814.2021.9486687]. | 1-gen-2021 | Portaluri,AndreaDe Sio, CorradoAzimi, SarahSterpone,Luca | PaperID-30-IOLTS2021.pdf; A_New_Domains-based_Isolation_Design_Flow_for_Reconfigurable_SoCs.pdf |
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