Archivio Istituzionale della RicercaSfoglia per Autore
A new hardware/software platform for the soft-error sensitivity evaluation of FPGA devices
2007 Violante, Massimo; SONZA REORDA, Matteo; Sterpone, Luca; Manuzzato, A.; Gerardin, S.; Rech, P.; Bagatin, M.; Paccagnella, A.; Andreani, C.; Gorini, G.; Pietropaolo, A.; Cardarilli, G.; Salsano, A.; Pontarelli, S.; Frost, C.
Sensitivity evaluation of TMR-hardened circuits to multiple SEUs induced by alpha particles in commercial SRAM-based FPGAs
2007 Manuzzato, A; Rech, P; Gerardin, S; Paccagnella, A; Sterpone, Luca; Violante, Massimo
A new hardware/software platform and a new 1/E neutron source for soft error studies: testing FPGAs at the ISIS facility
2007 Violante, Massimo; Sterpone, Luca; Manuzzato, A; Gerardin, S; Rech, P; Bagatin, M; Paccagnella, A; Andreani, C; Gorini, G; Pietropaolo, A; Cardarilli, G; Pontarelli, S; Frost, C.
DfT Reuse for Low-Cost Radiation Testing of SoCs: A Case Study
2009 Appello, D.; Bernardi, Paolo; Gerardin, S.; Grosso, Michelangelo; Paccagnella, A.; Rech, P.; SONZA REORDA, Matteo
Evaluating the impact of DFM library optimizations on alpha-induced SEU sensitivity in a microprocessor core
2009 Rech, P; Paccagnella, A; Grosso, Michelangelo; SONZA REORDA, Matteo; Melchiori, F; Appello, D.
Evaluating Alpha-induced Soft Errors in Embedded Microprocessors
2009 Bernardi, Paolo; Grosso, Michelangelo; SONZA REORDA, Matteo; Appello, D.; Rech, P.; Gerardin, S.; Paccagnella, A.
Evaluating the Impact of DFM Library Optimizations on Alpha-induced SEU Sensitivity in a Microprocessor Core
2010 Appello, D.; Grosso, Michelangelo; Loparco, D.; Melchiori, F.; Paccagnella, A.; Rech, P.; SONZA REORDA, Matteo
Analysis of Root Causes of Alpha Sensitivity Variations on Microprocessors Manufactured using Different Cell Layouts
2010 Rech, P.; Grosso, Michelangelo; Melchiori, F.; Loparco, D.; Appello, D.; Dilillo, L.; Paccagnella, A.; SONZA REORDA, Matteo
On the evaluation of soft-errors detection techniques for GPGPUs
2013 Sabena, Davide; SONZA REORDA, Matteo; Sterpone, Luca; Rech, P.; Carro, L.
Fault Injection in GPGPU Cores to Validate and Debug Robust Parallel Applications
2014 DE CARVALHO, Mauricio; Sabena, Davide; SONZA REORDA, Matteo; Sterpone, Luca; Rech, P.; Carro, L.
Software-Based Hardening Strategies for Neutron Sensitive FFT Algorithms on GPUs
2014 Pilla, L. L.; Rech, P.; Silvestri, F.; Frost, C.; Navaux, P. O. A.; SONZA REORDA, Matteo; Carro, L.
Reliability Evaluation of Embedded GPGPUs for Safety Critical Applications
2014 Sabena, Davide; Sterpone, Luca; Carro, L.; Rech, P.
Early Reliability Evaluation of a Biomedical System
2014 Hakobyan, H.; Rech, P.; SONZA REORDA, Matteo; Violante, Massimo
Evaluating the radiation sensitivity of GPGPU caches: New algorithms and experimental results
2014 Sabena, Davide; SONZA REORDA, Matteo; Sterpone, Luca; Rech, P.; Carro, L.
GPGPUs: How to combine high computational power with high reliability
2014 Bautista Gomez, L.; Cappello, F.; Carro, L.; Debardeleben, N.; Fang, B.; Gurumurthi, S.; Pattabiraman, K.; Rech, P.; SONZA REORDA, Matteo
Using Benchmarks for Radiation Testing of Microprocessors and FPGAs
2015 Robinson, W. H.; Rech, P.; Aguirre, M.; Barnard, A.; Desogus, M.; Entrena, L.; Garcia Valderas, M.; Guertin, S. M.; Kaeli, D.; Kastensmidt, F. L.; Kiddie, B. T.; Sanchez Clemente, A.; SONZA REORDA, Matteo; Sterpone, Luca; Wirthlin, M.
Using Benchmarks for Radiation Testing of Microprocessors and FPGAs
2015 Quinn, Heather; Robinson, William H.; Rech, Paolo; Aguirre, Miguel; Barnard, Arno; Desogus, Marco; Entrena, Luis; Garcia Valderas, Mario; Guertin, Steven M.; Kaeli, David; Kastensmidt, Fernanda Lima; Kiddie, Bradley T.; Sanchez Clemente, Antonio; SONZA REORDA, Matteo; Sterpone, Luca; Wirthlin, Michael
Special session: How approximate computing impacts verification, test and reliability
2018 Sekanina, L.; Vasicek, Z.; Bosio, A.; Traiola, M.; Rech, P.; Oliveria, D.; Fernandes, F.; Di Carlo, S.
Evaluating Architectural, Redundancy, and Implementation Strategies for Radiation Hardening of FinFET Integrated Circuits
2021 Pagliarini, Samuel; Benites, Luis; Martins, Mayler; Rech, Paolo; Kastensmidt, Fernanda
Revealing GPUs Vulnerabilities by Combining Register-Transfer and Software-Level Fault Injection
2021 Fernandes dos Santos, Fernando; Rodriguez Condia, Josie Esteban.; Carro, Luigi; Sonza Reorda, Matteo; Rech, Paolo
| Citazione | Data di pubblicazione | Autori | File |
|---|---|---|---|
| A new hardware/software platform for the soft-error sensitivity evaluation of FPGA devices / Violante, Massimo; SONZA REORDA, Matteo; Sterpone, Luca; Manuzzato, A.; Gerardin, S.; Rech, P.; Bagatin, M.; Paccagnella, A.; Andreani, C.; Gorini, G.; Pietropaolo, A.; Cardarilli, G.; Salsano, A.; Pontarelli, S.; Frost, C.. - STAMPA. - (2007), pp. 1-6. (Intervento presentato al convegno 8th IEEE Latin American Test Workshop tenutosi a Cuzco, Peru). | 1-gen-2007 | VIOLANTE, MASSIMOSONZA REORDA, MatteoSTERPONE, LucaRECH P. + | - |
| Sensitivity evaluation of TMR-hardened circuits to multiple SEUs induced by alpha particles in commercial SRAM-based FPGAs / Manuzzato, A; Rech, P; Gerardin, S; Paccagnella, A; Sterpone, Luca; Violante, Massimo. - (2007), pp. 79-86. (Intervento presentato al convegno International Symposium on Defect and Fault Tolerance in VLSI Systems). | 1-gen-2007 | RECH PSTERPONE, LucaVIOLANTE, MASSIMO + | - |
| A new hardware/software platform and a new 1/E neutron source for soft error studies: testing FPGAs at the ISIS facility / Violante, Massimo; Sterpone, Luca; Manuzzato, A; Gerardin, S; Rech, P; Bagatin, M; Paccagnella, A; Andreani, C; Gorini, G; Pietropaolo, A; Cardarilli, G; Pontarelli, S; Frost, C.. - In: IEEE TRANSACTIONS ON NUCLEAR SCIENCE. - ISSN 0018-9499. - (2007), pp. 1184-1189. [10.1109/TNS.2007.902349] | 1-gen-2007 | VIOLANTE, MASSIMOSTERPONE, LucaRECH P + | - |
| DfT Reuse for Low-Cost Radiation Testing of SoCs: A Case Study / Appello, D.; Bernardi, Paolo; Gerardin, S.; Grosso, Michelangelo; Paccagnella, A.; Rech, P.; SONZA REORDA, Matteo. - (2009), pp. 276-281. (Intervento presentato al convegno 27th IEEE VLSI Test Symposium (VTS '09) tenutosi a Santa Cruz, USA nel May 2009) [10.1109/VTS.2009.26]. | 1-gen-2009 | BERNARDI, PAOLOGROSSO, MICHELANGELOP. RECHSONZA REORDA, Matteo + | - |
| Evaluating the impact of DFM library optimizations on alpha-induced SEU sensitivity in a microprocessor core / Rech, P; Paccagnella, A; Grosso, Michelangelo; SONZA REORDA, Matteo; Melchiori, F; Appello, D.. - (2009), pp. 481-488. (Intervento presentato al convegno European Conference on Radiation and Its Effects on Components and Systems (RADECS) tenutosi a Bruges, Belgium nel Sept. 14-18, 2009) [10.1109/RADECS.2009.5994699]. | 1-gen-2009 | RECH PGROSSO, MICHELANGELOSONZA REORDA, Matteo + | - |
| Evaluating Alpha-induced Soft Errors in Embedded Microprocessors / Bernardi, Paolo; Grosso, Michelangelo; SONZA REORDA, Matteo; Appello, D.; Rech, P.; Gerardin, S.; Paccagnella, A.. - (2009). [10.1109/IOLTS.2009.5195985] | 1-gen-2009 | BERNARDI, PAOLOGROSSO, MICHELANGELOSONZA REORDA, MatteoP. RECH + | - |
| Evaluating the Impact of DFM Library Optimizations on Alpha-induced SEU Sensitivity in a Microprocessor Core / Appello, D.; Grosso, Michelangelo; Loparco, D.; Melchiori, F.; Paccagnella, A.; Rech, P.; SONZA REORDA, Matteo. - In: IEEE TRANSACTIONS ON NUCLEAR SCIENCE. - ISSN 0018-9499. - STAMPA. - 57:4(2010), pp. 2098-2105. [10.1109/TNS.2010.2049119] | 1-gen-2010 | GROSSO, MICHELANGELORECH P.SONZA REORDA, Matteo + | - |
| Analysis of Root Causes of Alpha Sensitivity Variations on Microprocessors Manufactured using Different Cell Layouts / Rech, P.; Grosso, Michelangelo; Melchiori, F.; Loparco, D.; Appello, D.; Dilillo, L.; Paccagnella, A.; SONZA REORDA, Matteo. - STAMPA. - (2010), pp. 29-34. (Intervento presentato al convegno IEEE 16th International On-Line Testing Symposium tenutosi a corfu (greece) nel july 2010). | 1-gen-2010 | P. RechGROSSO, MICHELANGELOSONZA REORDA, Matteo + | - |
| On the evaluation of soft-errors detection techniques for GPGPUs / Sabena, Davide; SONZA REORDA, Matteo; Sterpone, Luca; Rech, P.; Carro, L.. - ELETTRONICO. - (2013). (Intervento presentato al convegno 2013 8th IEEE International Design and Test Symposium (IDT) tenutosi a Marrakesh nel December 16-18, 2013). | 1-gen-2013 | SABENA, DAVIDESONZA REORDA, MatteoSTERPONE, LucaRech P. + | - |
| Fault Injection in GPGPU Cores to Validate and Debug Robust Parallel Applications / DE CARVALHO, Mauricio; Sabena, Davide; SONZA REORDA, Matteo; Sterpone, Luca; Rech, P.; Carro, L.. - (2014), pp. 210-211. (Intervento presentato al convegno IEEE 20th International On-Line Testing Symposium (IOLTS) tenutosi a Platja d'Aro nel July 7 - 9, 2014). | 1-gen-2014 | DE CARVALHO, MAURICIOSABENA, DAVIDESONZA REORDA, MatteoSTERPONE, LucaRech P. + | - |
| Software-Based Hardening Strategies for Neutron Sensitive FFT Algorithms on GPUs / Pilla, L. L.; Rech, P.; Silvestri, F.; Frost, C.; Navaux, P. O. A.; SONZA REORDA, Matteo; Carro, L.. - In: IEEE TRANSACTIONS ON NUCLEAR SCIENCE. - ISSN 0018-9499. - 61:4/1(2014), pp. 1874-1880. [10.1109/TNS.2014.2301768] | 1-gen-2014 | Rech P.SONZA REORDA, Matteo + | - |
| Reliability Evaluation of Embedded GPGPUs for Safety Critical Applications / Sabena, Davide; Sterpone, Luca; Carro, L.; Rech, P.. - In: IEEE TRANSACTIONS ON NUCLEAR SCIENCE. - ISSN 0018-9499. - ELETTRONICO. - 61:6(2014), pp. 3123-3129. [10.1109/TNS.2014.2363358] | 1-gen-2014 | SABENA, DAVIDESTERPONE, LucaRech P. + | - |
| Early Reliability Evaluation of a Biomedical System / Hakobyan, H.; Rech, P.; SONZA REORDA, Matteo; Violante, Massimo. - STAMPA. - (2014), pp. 45-50. (Intervento presentato al convegno 2014 9th International Design & Test Symposium tenutosi a Algiers, Algeria nel December 2014). | 1-gen-2014 | P. RechSONZA REORDA, MatteoVIOLANTE, MASSIMO + | - |
| Evaluating the radiation sensitivity of GPGPU caches: New algorithms and experimental results / Sabena, Davide; SONZA REORDA, Matteo; Sterpone, Luca; Rech, P.; Carro, L.. - In: MICROELECTRONICS RELIABILITY. - ISSN 0026-2714. - ELETTRONICO. - 54:11(2014), pp. 2621-2628. [10.1016/j.microrel.2014.05.001] | 1-gen-2014 | SABENA, DAVIDESONZA REORDA, MatteoSTERPONE, LucaRech P. + | - |
| GPGPUs: How to combine high computational power with high reliability / Bautista Gomez, L.; Cappello, F.; Carro, L.; Debardeleben, N.; Fang, B.; Gurumurthi, S.; Pattabiraman, K.; Rech, P.; SONZA REORDA, Matteo. - (2014). (Intervento presentato al convegno Design, Automation and Test in Europe Conference and Exhibition (DATE), 2014 tenutosi a Dresden, Germany nel March 2014) [10.7873/DATE2014.354]. | 1-gen-2014 | P. RechSONZA REORDA, Matteo + | - |
| Using Benchmarks for Radiation Testing of Microprocessors and FPGAs / Robinson, W. H.; Rech, P.; Aguirre, M.; Barnard, A.; Desogus, M.; Entrena, L.; Garcia Valderas, M.; Guertin, S. M.; Kaeli, D.; Kastensmidt, F. L.; Kiddie, B. T.; Sanchez Clemente, A.; SONZA REORDA, Matteo; Sterpone, Luca; Wirthlin, M.. - In: IEEE TRANSACTIONS ON NUCLEAR SCIENCE. - ISSN 0018-9499. - ELETTRONICO. - 62:6(2015), pp. 2547-2554. [10.1109/TNS.2015.2498313] | 1-gen-2015 | Rech, P.SONZA REORDA, MatteoSTERPONE, LUCA + | - |
| Using Benchmarks for Radiation Testing of Microprocessors and FPGAs / Quinn, Heather; Robinson, William H.; Rech, Paolo; Aguirre, Miguel; Barnard, Arno; Desogus, Marco; Entrena, Luis; Garcia Valderas, Mario; Guertin, Steven M.; Kaeli, David; Kastensmidt, Fernanda Lima; Kiddie, Bradley T.; Sanchez Clemente, Antonio; SONZA REORDA, Matteo; Sterpone, Luca; Wirthlin, Michael. - In: IEEE TRANSACTIONS ON NUCLEAR SCIENCE. - ISSN 0018-9499. - STAMPA. - 62:6(2015), pp. 2547-2554. [10.1109/TNS.2015.2498313] | 1-gen-2015 | RECH, PAOLODESOGUS, MARCOSONZA REORDA, MatteoSTERPONE, LUCA + | 07348783.pdf |
| Special session: How approximate computing impacts verification, test and reliability / Sekanina, L.; Vasicek, Z.; Bosio, A.; Traiola, M.; Rech, P.; Oliveria, D.; Fernandes, F.; Di Carlo, S.. - ELETTRONICO. - 2018:(2018), pp. 1-1. (Intervento presentato al convegno 36th IEEE VLSI Test Symposium, VTS 2018 tenutosi a San Francisco, USA nel 22-25 April, 2018) [10.1109/VTS.2018.8368628]. | 1-gen-2018 | Rech, P.Di Carlo, S. + | camera_ready.pdf |
| Evaluating Architectural, Redundancy, and Implementation Strategies for Radiation Hardening of FinFET Integrated Circuits / Pagliarini, Samuel; Benites, Luis; Martins, Mayler; Rech, Paolo; Kastensmidt, Fernanda. - In: IEEE TRANSACTIONS ON NUCLEAR SCIENCE. - ISSN 0018-9499. - 68:5(2021), pp. 1045-1053. [10.1109/TNS.2021.3070643] | 1-gen-2021 | Paolo, Rech + | FINAL VERSION.pdf; Evaluating_Architectural_Redundancy_and_Implementation_Strategies_for_Radiation_Hardening_of_FinFET_Integrated_Circuits.pdf |
| Revealing GPUs Vulnerabilities by Combining Register-Transfer and Software-Level Fault Injection / Fernandes dos Santos, Fernando; Rodriguez Condia, Josie Esteban.; Carro, Luigi; Sonza Reorda, Matteo; Rech, Paolo. - ELETTRONICO. - (2021), pp. 292-304. (Intervento presentato al convegno 51st Annual IEEE/IFIP International Conference on Dependable Systems and Networks, DSN 2021 tenutosi a twn nel 2021) [10.1109/DSN48987.2021.00042]. | 1-gen-2021 | Rodriguez Condia, Josie Esteban.Carro, LuigiSonza Reorda, MatteoRech, Paolo + | dsn_2021_end.pdf; Revealing_GPUs_Vulnerabilities_by_Combining_Register-Transfer_and_Software-Level_Fault_Injection.pdf |
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