Sfoglia per Autore  YANG, WEITAO

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Citazione Data di pubblicazione Autori File
Electron inducing soft errors in 28 nm system-on-Chip / Yang, W.; Li, Y.; Zhang, W.; Guo, Y.; Zhao, H.; Wei, J.; Li, Y.; He, C.; Chen, K.; Guo, G.; Du, B.; Sterpone, L.. - In: RADIATION EFFECTS AND DEFECTS IN SOLIDS. - ISSN 1042-0150. - 175:7-8(2020), pp. 745-754. [10.1080/10420150.2020.1759067] 1-gen-2020 Yang W.Du B.Sterpone L. + Electron inducing soft errors in 28 nm system on Chip.pdf
A New Single Event Transient Hardened Floating Gate Configurable Logic Circuit / Azimi, Sarah; De Sio, Corrado; Yang, Weitao; Sterpone, Luca. - ELETTRONICO. - (2020), pp. 311-314. ((Intervento presentato al convegno 18th IEEE International NEWCAS tenutosi a Montreal, Canada nel June 16-19, 2020 [10.1109/NEWCAS49341.2020.9159844]. 1-gen-2020 Sarah AzimiCorrado De SioWeitao YangLuca Sterpone NEWCAS_2020.pdf09159844.pdf
Investigation of Single Event Effect in 28nm System-on-Chip with Multi Patterns / Yang, Weitao; Li, Yong-hong; Guo, Ya-xin; Zhao, Hao-yu; Li, Yang; Li, Pei; He, Chao-hui; Guo, Gang; Liu, Jie; Yang, Sheng-Sheng; An, Heng. - In: CHINESE PHYSICS B. - ISSN 1674-1056. - ELETTRONICO. - (2020). [10.1088/1674-1056/ab99b8] 1-gen-2020 Yang, Weitao + Chinese Physics B.pdf200930-final proof.pdf
Reliability assessment on 16 nm ultrascale+ MPSoC using fault injection and fault tree analysis / Yang, Weitao; Du, Boyang; He, Chaohui; Sterpone, Luca. - In: MICROELECTRONICS RELIABILITY. - ISSN 0026-2714. - 120:(2021), p. 114122. [10.1016/j.microrel.2021.114122] 1-gen-2021 Yang, WeitaoDu, BoyangSterpone, Luca + 1-s2.0-S0026271421000883-main.pdf
Research on Reliability of Nanoscale System on Chips / Yang, Weitao. - (2022). 1-gen-2022 Yang, Weitao Weitao Yang-Dissertation-Final.pdf
Research on Reliability of Nanoscale System on Chips / Yang, Weitao. - (2022 Jan 21), pp. 1-127. 21-gen-2022 YANG, WEITAO Weitao_Yang-Dissertation-Final.pdfWeitao_Yang-Dissertation-Abstract-Eng.pdf
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