Sfoglia per Serie ... IEEE ... INTERNATIONAL SYMPOSIUM ON DESIGN AND DIAGNOSTICS OF ELECTRONIC CIRCUITS & SYSTEMS
Mostrati risultati da 1 a 5 di 5
Early Detection of Permanent Faults in DNNs Through the Application of Tensor-Related Metrics
2024 Turco, V.; Ruospo, A.; Sanchez, E.; Sonza Reorda, M.
Efficient Neural Network Approximation via Bayesian Reasoning
2021 Savino, A.; Traiola, M.; Di Carlo, S.; Bosio, A.
HermesBDD: A Multi-Core and Multi-Platform Binary Decision Diagram Package
2023 Capogrosso, L; Geretti, L; Cristani, M; Fummi, F; Villa, T
A Reliability-aware Environment for Design Exploration for GPU Devices
2023 Limas Sierra, Robert; Guerrero Balaguera, Juan David; Rodriguez Condia, Josie Esteban; Sonza Reorda, Matteo
Split-Et-Impera: A Framework for the Design of Distributed Deep Learning Applications
2023 Capogrosso, L; Cunico, F; Lora, M; Cristani, M; Fummi, F; Quaglia, D
Citazione | Data di pubblicazione | Autori | File |
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Early Detection of Permanent Faults in DNNs Through the Application of Tensor-Related Metrics / Turco, V.; Ruospo, A.; Sanchez, E.; Sonza Reorda, M.. - ELETTRONICO. - (2024), pp. 13-18. (Intervento presentato al convegno 2024 27th International Symposium on Design & Diagnostics of Electronic Circuits & Systems (DDECS) tenutosi a Kielce (POL) nel 03-05 April 2024) [10.1109/DDECS60919.2024.10508918]. | 1-gen-2024 | Turco V.Ruospo A.Sanchez E.Sonza Reorda M. | Early_Detection_of_Permanent_Faults_in_DNNs_Through_the_Application_of_Tensor-Related_Metrics.pdf |
Efficient Neural Network Approximation via Bayesian Reasoning / Savino, A.; Traiola, M.; Di Carlo, S.; Bosio, A.. - STAMPA. - (2021), pp. 45-50. (Intervento presentato al convegno 24th International Symposium on Design and Diagnostics of Electronic Circuits and Systems, DDECS 2021 tenutosi a Vienna, Austria nel 2027-9 April 20211) [10.1109/DDECS52668.2021.9417057]. | 1-gen-2021 | Savino A.Di Carlo S. + | DDECS2021.pdf; Efficient_Neural_Network_Approximation_via_Bayesian_Reasoning.pdf |
HermesBDD: A Multi-Core and Multi-Platform Binary Decision Diagram Package / Capogrosso, L; Geretti, L; Cristani, M; Fummi, F; Villa, T. - (2023), pp. 87-90. (Intervento presentato al convegno 26th International Symposium on Design and Diagnostics of Electronic Circuits and Systems (DDECS) tenutosi a Tallinn (EST) nel May 3-5, 2023) [10.1109/DDECS57882.2023.10139480]. | 1-gen-2023 | Capogrosso, LFummi, FVilla, T + | HermesBDD_A_Multi-Core_and_Multi-Platform_Binary_Decision_Diagram_Package.pdf |
A Reliability-aware Environment for Design Exploration for GPU Devices / Limas Sierra, Robert; Guerrero Balaguera, Juan David; Rodriguez Condia, Josie Esteban; Sonza Reorda, Matteo. - (2023), pp. 169-174. (Intervento presentato al convegno 2023 26th International Symposium on Design and Diagnostics of Electronic Circuits and Systems (DDECS) tenutosi a Tallinn (Estonia) nel 03-05 May 2023) [10.1109/DDECS57882.2023.10139643]. | 1-gen-2023 | Limas Sierra, RobertGuerrero Balaguera, Juan DavidRodriguez Condia, Josie EstebanSonza Reorda, Matteo | A_Reliability-aware_Environment_for_Design_Exploration_for_GPU_Devices.pdf |
Split-Et-Impera: A Framework for the Design of Distributed Deep Learning Applications / Capogrosso, L; Cunico, F; Lora, M; Cristani, M; Fummi, F; Quaglia, D. - ELETTRONICO. - (2023), pp. 39-44. (Intervento presentato al convegno 26th International Symposium on Design and Diagnostics of Electronic Circuits and Systems (DDECS) tenutosi a Tallinn (EST) nel May 3-5, 2023) [10.1109/DDECS57882.2023.10139711]. | 1-gen-2023 | Capogrosso, LFummi, FQuaglia, D + | Split-Et-Impera_A_Framework_for_the_Design_of_Distributed_Deep_Learning_Applications.pdf |
Mostrati risultati da 1 a 5 di 5
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